Inventor · disambiguated record
Takaki Yoshida
Also filed as: YOSHIDA TAKAKI
8 granted patents·2 pending applications·62 citations·filing 2000–2016
86Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD4PANASONIC CORP2MIURA-MATTAUSCH MITIKO1NIPPON SEIKI CO LTD1SYSMEX CORP1
Top patents by PatentIndex Score
10 records- 0181US7594206B2Fault detecting method and layout method for semiconductor integrated circuitPANASONIC CORP·Filed 2006·Granted Sep 22, 2009·11 cites·10 claims
- 0278US7441168B2Fault detecting method and layout method for semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Oct 21, 2008·9 cites·4 claims
- 0371US7743726B2Indication instrumentNIPPON SEIKI CO LTD·Filed 2006·Granted Jun 29, 2010·9 cites·4 claims
- 0468US7065690B1Fault detecting method and layout method for semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jun 20, 2006·14 cites·6 claims
- 0561US7188326B2Methods for designing and testing semiconductor integrated circuits with plural clock groupsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Mar 6, 2007·10 cites·11 claims
- 0656US7216315B2Error portion detecting method and layout method for semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted May 8, 2007·6 cites·11 claims
- 0744US8731893B2Circuit simulation of MOSFETsMIURA-MATTAUSCH MITIKO·Filed 2011·Granted May 20, 2014·1 cites·12 claims
- 0836US7484166B2Semiconductor integrated circuit verification method and test pattern preparation methodPANASONIC CORP·Filed 2004·Granted Jan 27, 2009·2 cites·20 claims
- 0935US2007011506A1Semiconductor integrated circuit verifying and inspecting methodYOSHIDA TAKAKI·Filed 2006·Application pending·0 cites
- 1035US2017059594A1Reagent for activated partial thromboplastin time measurement, reagent kit for activated partial thromboplastin time measurement, and method for measuring activated partial thrombopalstin timeSYSMEX CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →