Inventor · disambiguated record
Takehisa Yoshikawa
Also filed as: YOSHIKAWA TAKEHISA
6 granted patents·1 pending application·60 citations·filing 1994–2012
82Inventor score
Top patents by PatentIndex Score
7 records- 0186US7009774B2Microlens array, a method for making a transfer master pattern for microlens array, a concave and convex pattern obtained from the transfer master pattern, a laminate for transfer, a diffuse reflection plate and a liquid crystal display deviceHITACHI CHEMICAL CO LTD·Filed 2004·Granted Mar 7, 2006·28 cites·2 claims
- 0279US6898015B2Microlens array, a method for making a transfer master pattern for microlens array, a concave and convex pattern obtained from the transfer master pattern, a laminate for transfer, a diffuse reflection plate and a liquid crystal display deviceHITACHI CHEMICAL CO LTD·Filed 2003·Granted May 24, 2005·17 cites·23 claims
- 0373US6654176B2Microlens array, a method for making a transfer master pattern for microlens array, a concave and convex pattern obtained from the transfer master pattern, a laminate for transfer, a diffuse reflection plate and a liquid crystal display deviceHITACHI LTD·Filed 2002·Granted Nov 25, 2003·8 cites·16 claims
- 0469US7889310B2Method for producing apertures in a diffuse reflector layer having a metal reflection filmHITACHI CHEMICAL CO LTD·Filed 2007·Granted Feb 15, 2011·5 cites·7 claims
- 0549US6538385B2Cathode-ray tube and flat electrode of electronic gun and production methodHITACHI LTD·Filed 2001·Granted Mar 25, 2003·1 cites·15 claims
- 0639US2014123740A1Working Abnormality Detecting Device and Working Abnormality Detecting Method for Machine ToolYOSHIKAWA TAKEHISA·Filed 2012·Application pending·0 cites
- 0722US5564247AHigh-rigidity sheet-metal structureHITACHI LTD·Filed 1994·Granted Oct 15, 1996·1 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →