Inventor · disambiguated record
Tetsuya Akashi
Also filed as: AKASHI TETSUYA
10 granted patents·1 pending application·75 citations·filing 1976–2024
86Inventor score
Top patents by PatentIndex Score
11 records- 0187US7538323B2InterferometerRIKEN·Filed 2005·Granted May 26, 2009·13 cites·16 claims
- 0285US7750298B2Interferometer having three electron biprismsRIKEN·Filed 2006·Granted Jul 6, 2010·10 cites·10 claims
- 0384US7816648B2Electron interferometer or electron microscopeRIKEN·Filed 2005·Granted Oct 19, 2010·10 cites·30 claims
- 0480US7872755B2InterferometerRIKEN·Filed 2006·Granted Jan 18, 2011·8 cites·9 claims
- 0580US7655905B2Charged particle beam equipmentRIKEN·Filed 2006·Granted Feb 2, 2010·6 cites·24 claims
- 0675US12400820B2Field emission electron source, electron optical device, and manufacturing methodHITACHI LTD·Filed 2024·Granted Aug 26, 2025·0 cites·6 claims
- 0758US4114670AMethod for securing screw means onto metal plate and metal plate having screw means securedTOPURA CO LTD KABUSHIKI KAISHA·Filed 1976·Granted Sep 19, 1978·28 cites·15 claims
- 0856US10872743B2Sample holding mechanism, manufacturing method for same, and charged particle beam deviceHITACHI LTD·Filed 2018·Granted Dec 22, 2020·0 cites·12 claims
- 0951US2021110992A1Image collection systemHITACHI LTD·Filed 2020·Application pending·0 cites
- 1047US11011344B2Interferometric electron microscopeHITACHI LTD·Filed 2020·Granted May 18, 2021·0 cites·12 claims
- 1138US10629410B2Electron microscope for magnetic field measurement and magnetic field measurement methodHITACHI LTD·Filed 2017·Granted Apr 21, 2020·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →