Inventor · disambiguated record
Teiji Katsuta
Also filed as: KATSUTA TEIJI
3 granted patents·22 citations·filing 1979–1993
67Inventor score
Files withHITACHI LTD3
Top patents by PatentIndex Score
3 records- 0167US4264822AElectron beam testing method and apparatus of maskHITACHI LTD·Filed 1979·Granted Apr 28, 1981·12 cites·10 claims
- 0232US4363953AElectron beam scribing methodHITACHI LTD·Filed 1980·Granted Dec 14, 1982·8 cites·2 claims
- 0325US5457317AElectron microscope, a camera for such an electron microscope, and a method of operating such an electron microscopeHITACHI LTD·Filed 1993·Granted Oct 10, 1995·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →