Inventor · disambiguated record
Teruo Kohashi
Also filed as: KOHASHI TERUO
14 granted patents·7 pending applications·21 citations·filing 2005–2023
86Inventor score
Top patents by PatentIndex Score
21 records- 0186US11163974B2Image acquisition system and image acquisition methodHITACHI LTD·Filed 2020·Granted Nov 2, 2021·2 cites·14 claims
- 0286US7755046B2Transmission electron microscopeHITACHI LTD·Filed 2008·Granted Jul 13, 2010·9 cites·8 claims
- 0380US11170972B2Scanning electron microscope and method for analyzing secondary electron spin polarizationHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 9, 2021·2 cites·15 claims
- 0474US10395885B2Charged particle device, charged particle irradiation method, and analysis deviceHITACHI LTD·Filed 2015·Granted Aug 27, 2019·2 cites·13 claims
- 0565US10304657B2Mirror ion microscope and ion beam control methodHITACHI LTD·Filed 2015·Granted May 28, 2019·1 cites·10 claims
- 0664US8022364B2Electron spin detector, and spin polarized scanning electron microscope and spin-resolved x-ray photoelectron spectroscope using the electron spin detectorHITACHI LTD·Filed 2009·Granted Sep 20, 2011·4 cites·11 claims
- 0761US11756763B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·13 claims
- 0859US12400827B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 26, 2025·0 cites·18 claims
- 0958US2024126061A1Scanning probe microscopeHITACHI LTD·Filed 2023·Application pending·0 cites
- 1056US2009054722A1Drug Carrier Containing Magnetic Fine Particles and System Using the SameSUGANO RYOKO·Filed 2008·Application pending·0 cites
- 1155US10210962B2Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction gratingHITACHI LTD·Filed 2014·Granted Feb 19, 2019·1 cites·10 claims
- 1252US11587226B2Magnetic domain image processing apparatus and magnetic domain image processing methodHITACHI LTD·Filed 2022·Granted Feb 21, 2023·0 cites·8 claims
- 1352US7985952B2Charged particle spin polarimeter, microscope, and photoelectron spectroscopeHITACHI LTD·Filed 2008·Granted Jul 26, 2011·0 cites·15 claims
- 1451US11139143B2Spin polarimeterHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 5, 2021·0 cites·13 claims
- 1551US2024249911A1Spin-polarized scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1651US2025006454A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1750US11961699B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 16, 2024·0 cites·15 claims
- 1846US9864114B2Zone plate having annular or spiral shape and Y-shaped branching edge dislocationHARADA KEN·Filed 2011·Granted Jan 9, 2018·0 cites·7 claims
- 1945US2007194230A1Inspection instrument of a magnetic specimenKOHASHI TERUO·Filed 2007·Application pending·0 cites
- 2044US2006093863A1Magnetic recording medium, manufacturing process thereof, and magnetic recording apparatusHITACHI LTD·Filed 2005·Application pending·0 cites
- 2141US2007057666A1Defect inspection system and method for recording mediaSHIMAKURA TOMOKAZU·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →