Inventor · disambiguated record
Tetsushi Koide
Also filed as: KOIDE TETSUSHI
21 granted patents·3 pending applications·140 citations·filing 2003–2023
94Inventor score
Files withUNIV HIROSHIMA11MATTAUSCH HANS JUERGEN3SEMICONDUCTOR TECH ACAD RES CT3UNIV HIROSHIMA PRESIDENT3HIROSHIMA UNIVERSITY A NAT UNI1
Top patents by PatentIndex Score
24 records- 0181US7360024B2Multi-port integrated cacheSEMICONDUCTOR TECH ACAD RES CT·Filed 2003·Granted Apr 15, 2008·33 cites·5 claims
- 0271US7881525B2Reference data optimization learning method and pattern recognition systemUNIV HIROSHIMA·Filed 2006·Granted Feb 1, 2011·6 cites·19 claims
- 0370US7694077B2Multi-port integrated cacheSEMICONDUCTOR TECH ACAD RES CT·Filed 2008·Granted Apr 6, 2010·5 cites·11 claims
- 0469US7853075B2Image segmentation apparatus and image segmentation methodUNIV HIROSHIMA·Filed 2008·Granted Dec 14, 2010·7 cites·17 claims
- 0566US7860328B2Compression processing apparatus and compression processing methodUNIV HIROSHIMA·Filed 2008·Granted Dec 28, 2010·3 cites·10 claims
- 0665US7298899B2Image segmentation method, image segmentation apparatus, image processing method, and image processing apparatusUNIV HIROSHIMA PRESIDENT·Filed 2003·Granted Nov 20, 2007·14 cites·24 claims
- 0763US7203382B2Pattern matching and pattern recognition system, associative memory apparatus, and pattern matching and pattern recognition processing methodUNIV HIROSHIMA PRESIDENT·Filed 2003·Granted Apr 10, 2007·19 cites·13 claims
- 0863US7113416B2Associative memory apparatus for searching data in which manhattan distance is minimumUNIV HIROSHIMA·Filed 2004·Granted Sep 26, 2006·13 cites·4 claims
- 0958US7746678B2Amplifier circuit and associative memoryUNIV HIROSHIMA·Filed 2008·Granted Jun 29, 2010·4 cites·6 claims
- 1058US7599557B2Image segmentation apparatus, image segmentation method, and image segmentation integrated circuit for processing an imageUNIV HIROSHIMA·Filed 2008·Granted Oct 6, 2009·3 cites·11 claims
- 1153US7526127B2Image segmentation apparatus, image segmentation method, and image segmentation integrated circuit with low power consumption for large-scale imagesHIROSHIMA UNIVERSITY A NAT UNI·Filed 2004·Granted Apr 28, 2009·12 cites·6 claims
- 1253US2023214970A1Skin surface analysis device and skin surface analysis methodUNIV HIROSHIMA·Filed 2023·Application pending·0 cites
- 1347US8587980B2Associative memoryMATTAUSCH HANS JUERGEN·Filed 2010·Granted Nov 19, 2013·2 cites·12 claims
- 1447US7561743B2Reference data recognition and learning method and pattern recognition systemUNIV HIROSHIMA·Filed 2004·Granted Jul 14, 2009·8 cites·10 claims
- 1547US7117291B2Memory with synchronous bank architectureSEMICONDUCTOR TECH ACAD RES CT·Filed 2004·Granted Oct 3, 2006·6 cites·15 claims
- 1644US8937828B2Associative memoryMATTAUSCH HANS JUERGEN·Filed 2012·Granted Jan 20, 2015·1 cites·9 claims
- 1744US7957171B2Associative memory and searching system using the sameUNIV HIROSHIMA·Filed 2008·Granted Jun 7, 2011·1 cites·4 claims
- 1842US12146131B2Testing apparatus and testing methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 19, 2024·0 cites·15 claims
- 1941US6853251B2Self-adjusting winner lineup amplifierUNIV HIROSHIMA PRESIDENT·Filed 2003·Granted Feb 8, 2005·3 cites·9 claims
- 2036US8331120B2Offset removal circuit, associative memory including the same, and offset voltage removal methodMATTAUSCH HANS JUERGEN·Filed 2008·Granted Dec 11, 2012·0 cites·24 claims
- 2136US2010179976A1Semiconductor device performing operational processingRENESAS TECH CORP·Filed 2010·Application pending·0 cites
- 2236US2008106469A1Semiconductor DeviceJAPAN SCIENCE & TECH AGENCY·Filed 2004·Application pending·0 cites
- 2328US10062161B2Endoscopic image diagnosis support system for computing average values of identification probabilities of pathological typesUNIV HIROSHIMA·Filed 2015·Granted Aug 28, 2018·0 cites·20 claims
- 2426US9959473B2Symbol recognition device and traffic sign recognition deviceUNIV HIROSHIMA·Filed 2016·Granted May 1, 2018·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →