Inventor · disambiguated record
Teng-Yok Lee
Also filed as: LEE TENG-YOK
7 granted patents·8 pending applications·39 citations·filing 2009–2025
79Inventor score
Top patents by PatentIndex Score
15 records- 0192US10417524B2Deep active learning method for civil infrastructure defect detectionMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2017·Granted Sep 17, 2019·17 cites·18 claims
- 0291US10748035B2Visually aided active learning for training object detectorMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2018·Granted Aug 18, 2020·19 cites·20 claims
- 0368US2025355967A1Data processing device and data processing methodMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0464US2025329025A1Object detecting apparatus and object detection methodMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0563US12417625B2Loss contribution detecting method and loss contribution detecting systemMITSUBISHI ELECTRIC CORP·Filed 2023·Granted Sep 16, 2025·0 cites·5 claims
- 0662US10769500B2Localization-aware active learning for object detectionMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2017·Granted Sep 8, 2020·1 cites·21 claims
- 0762US8781183B2Enhanced visualizations for ultrasound videosPORIKLI FATIH M·Filed 2009·Granted Jul 15, 2014·2 cites·13 claims
- 0862US2024361989A1Similarity contribution detecting method and similarity contribution detecting systemMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0957US2024160661A1Image retrieving device and image retrieving methodMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1054US2025181634A1Image retrieval apparatusMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 1150US2025148044A1Method and system for configuring preprocessing for supervised learning modelMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 1243US10353352B2System and method for distributed machining simulationMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2017·Granted Jul 16, 2019·0 cites·20 claims
- 1340US10416681B2Barcode: global binary patterns for fast visual inferenceMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2017·Granted Sep 17, 2019·0 cites·17 claims
- 1440US2019213790A1Method and System for Semantic Labeling of Point CloudsMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2018·Application pending·0 cites
- 1536US2018099151A1Method of Visualizing and Setting Dose Constraints for Radiation TherapyMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →