Inventor · disambiguated record
Te-Kun Lin
Also filed as: LIN TE-KUN
4 granted patents·3 pending applications·1 citations·filing 2005–2025
59Inventor score
Top patents by PatentIndex Score
7 records- 0180US12429501B2Method for detecting contact force of probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 30, 2025·0 cites·20 claims
- 0278US2025341543A1Method for detecting contact force of probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0377US2025290952A1Probe card needle shape and method of manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0477US2025290953A1Probe card needle shape and method of manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0571US12326463B2Probe card needle shape and method of manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 10, 2025·0 cites·20 claims
- 0669US12055563B2Probe card, apparatus and method for detecting contact force of probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 6, 2024·0 cites·20 claims
- 0757US7182814B1Sample holder for physical vapor deposition equipmentLIN TE-KUN·Filed 2005·Granted Feb 27, 2007·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →