Inventor · disambiguated record
Tetsuya Matsui
Also filed as: MATSUI TETSUYA
37 granted patents·9 pending applications·628 citations·filing 1989–2021
97Inventor score
Files withHITACHI LTD30HITACHI GE NUCLEAR ENERGY LTD4TOYO ALUMINIUM KK2KONAMI DIGITAL ENTERTAINMENT CO LTD1MITSUBISHI HITACHI POWER SYS1
Top patents by PatentIndex Score
46 records- 0192US7171854B2Nondestructive inspection apparatus and nondestructive inspection method using elastic guided waveHITACHI LTD·Filed 2004·Granted Feb 6, 2007·54 cites·18 claims
- 0292US7093490B2Ultrasonic flaw detecting method and ultrasonic flaw detectorHITACHI LTD·Filed 2005·Granted Aug 22, 2006·22 cites·6 claims
- 0392US6167514AMethod, apparatus, system and information storage medium for wireless communicationSEIKO EPSON CORP·Filed 1997·Granted Dec 26, 2000·167 cites·23 claims
- 0488US7884924B2Residual stress measuring method and systemHITACHI LTD·Filed 2007·Granted Feb 8, 2011·20 cites·14 claims
- 0588US7235967B2Eddy current testing probe and eddy current testing apparatusHITACHI LTD·Filed 2006·Granted Jun 26, 2007·13 cites·13 claims
- 0687US5991360ALaser plasma x-ray source, semiconductor lithography apparatus using the same and a method thereofHITACHI LTD·Filed 1998·Granted Nov 23, 1999·109 cites·11 claims
- 0785US7841237B2Ultrasonic testing apparatus for turbine forks and method thereofHITACHI LTD·Filed 2007·Granted Nov 30, 2010·13 cites·7 claims
- 0883US5369674APlant diagnosis apparatus and methodHITACHI LTD·Filed 1992·Granted Nov 29, 1994·27 cites·44 claims
- 0981US8681328B2Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatusTANIGUCHI ATSUSHI·Filed 2010·Granted Mar 25, 2014·4 cites·18 claims
- 1081US6957583B2Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection methodHITACHI LTD·Filed 2003·Granted Oct 25, 2005·24 cites·20 claims
- 1181US6778877B2Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management methodHITACHI LTD·Filed 2001·Granted Aug 17, 2004·14 cites·4 claims
- 1278US6891476B2Electronic exposure dose meter and radiation handling operation management system employing the sameHITACHI LTD·Filed 2002·Granted May 10, 2005·20 cites·15 claims
- 1376US7872472B2Eddy current testing apparatus and eddy current testing methodHITACHI LTD·Filed 2009·Granted Jan 18, 2011·4 cites·6 claims
- 1476US6980883B2Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management methodHITACHI LTD·Filed 2004·Granted Dec 27, 2005·7 cites·1 claims
- 1575US7092960B2Chemical material integrated management system and method thereofHITACHI LTD·Filed 2001·Granted Aug 15, 2006·11 cites·2 claims
- 1675US5316983AApparatus for analysis of particulate material, analytical method for same, apparatus for production of ultrapure water, apparatus for manufacturing of semiconductor, and apparatus for production of pure gasHITACHI LTD·Filed 1991·Granted May 31, 1994·42 cites·29 claims
- 1773US7772840B2Eddy current testing methodHITACHI LTD·Filed 2009·Granted Aug 10, 2010·3 cites·14 claims
- 1871US7272465B2Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management methodHITACHI LTD·Filed 2005·Granted Sep 18, 2007·1 cites·3 claims
- 1969US5178836AAnalytical method for particulate substances, relevant analytical equipment and its application systemHITACHI LTD·Filed 1989·Granted Jan 12, 1993·27 cites·25 claims
- 2068US6934640B2Method and system for comprehensive management of chemical materialsHITACHI LTD·Filed 2001·Granted Aug 23, 2005·2 cites·39 claims
- 2166US10758815B2Game management device, game system, and computer-readable storage medium having program recorded thereonKONAMI DIGITAL ENTERTAINMENT CO LTD·Filed 2016·Granted Sep 1, 2020·2 cites·5 claims
- 2266US2021327625A1Lagging materialHITACHI GE NUCLEAR ENERGY LTD·Filed 2021·Application pending·0 cites
- 2362US11473908B2Ultrasonic inspection systemHITACHI GE NUCLEAR ENERGY LTD·Filed 2019·Granted Oct 18, 2022·1 cites·5 claims
- 2462US7536239B2Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management methodHITACHI LTD·Filed 2007·Granted May 19, 2009·0 cites·6 claims
- 2562US7532946B2Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management methodHITACHI LTD·Filed 2007·Granted May 12, 2009·0 cites·12 claims
- 2662US7433757B2Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management methodHITACHI LTD·Filed 2007·Granted Oct 7, 2008·0 cites·10 claims
- 2760US5164592AMethod and apparatus for mass spectrometric analysisHITACHI LTD·Filed 1990·Granted Nov 17, 1992·15 cites·27 claims
- 2858US12022841B2Film for preserving edible meatTOYO ALUMINIUM KK·Filed 2019·Granted Jul 2, 2024·0 cites·10 claims
- 2958US2018356369A1Lagging materialHITACHI GE NUCLEAR ENERGY LTD·Filed 2018·Application pending·0 cites
- 3056US8982332B2Distance measuring device and distance measuring methodTACHIZAKI TAKEHIRO·Filed 2011·Granted Mar 17, 2015·2 cites·8 claims
- 3156US2002133302A1Environmental performance improvement support system and environmental performance improvement support methodHITACHI LTD·Filed 2002·Application pending·0 cites
- 3255US6639392B2Charged particle measuring device and measuring method thereofHITACHI LTD·Filed 2002·Granted Oct 28, 2003·5 cites·22 claims
- 3355US2002004768A1Method and system for comprehensive management of chemical materialsFiled 2001·Application pending·0 cites
- 3453US2008079426A1Eddy current testing apparatus and eddy current testing methodSUZUKI YUTAKA·Filed 2007·Application pending·0 cites
- 3550US7151262B1Radioactive gas measurement apparatus and failed fuel detection systemHITACHI LTD·Filed 2004·Granted Dec 19, 2006·3 cites·4 claims
- 3649US9134279B2Internal defect inspection method and apparatus for the sameNAKATA TOSHIHIKO·Filed 2011·Granted Sep 15, 2015·0 cites·14 claims
- 3747US11002709B2Ultrasonic inspection systemHITACHI GE NUCLEAR ENERGY LTD·Filed 2018·Granted May 11, 2021·0 cites·6 claims
- 3846US2020289332A1Orthopedic fixing memberTOYO ALUMINIUM KK·Filed 2020·Application pending·0 cites
- 3944US9689660B2Method and device for monitoring status of turbine bladesMITSUBISHI HITACHI POWER SYS·Filed 2014·Granted Jun 27, 2017·0 cites·3 claims
- 4043US8621659B2Cantilever for magnetic force microscope and method of manufacturing the sameZHANG KAIFENG·Filed 2012·Granted Dec 31, 2013·0 cites·11 claims
- 4143US5070300AApparatus for measuring breakdown plasmaHITACHI LTD·Filed 1989·Granted Dec 3, 1991·9 cites·8 claims
- 4242US2007061044A1Method and system for comprehensive management of chemical materialsSEKINE AKIRA·Filed 2006·Application pending·0 cites
- 4339US6774638B2Charged particle measuring device and measuring method thereofHITACHI LTD·Filed 2003·Granted Aug 10, 2004·0 cites·11 claims
- 4439US2002084420A1Radioactive gas measurement apparatus and failed fuel detection systemHITACHI LTD·Filed 2002·Application pending·0 cites
- 4538US5122752AMethod of and apparatus for analyzing granular materialsHITACHI LTD·Filed 1990·Granted Jun 16, 1992·7 cites·19 claims
- 4638US2002180606A1Electronic exposure dose meter and radiation handling operation management system employing the sameHITACHI LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →