Inventor · disambiguated record
Tetsuhisa Nakano
Also filed as: NAKANO TETSUHISA
4 granted patents·13 citations·filing 2010–2014
69Inventor score
Top patents by PatentIndex Score
4 records- 0177US9846028B2Film thickness measurement method and film thickness measurement deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Dec 19, 2017·3 cites·21 claims
- 0277US8885173B2Film thickness measurement device and film thickness measurement methodOHTSUKA KENICHI·Filed 2010·Granted Nov 11, 2014·6 cites·10 claims
- 0375US8699023B2Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring methodOHTSUKA KENICHI·Filed 2011·Granted Apr 15, 2014·3 cites·10 claims
- 0455US8649023B2Film thickness measurement device and measurement methodOHTSUKA KENICHI·Filed 2010·Granted Feb 11, 2014·1 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →