Inventor · disambiguated record
Terumichi Nishino
Also filed as: NISHINO TERUMICHI
2 granted patents·53 citations·filing 2002–2004
61Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH CORP2
Top patents by PatentIndex Score
2 records- 0191US6791084B2Method and scanning electron microscope for measuring dimension of material on sampleHITACHI HIGH TECH CORP·Filed 2002·Granted Sep 14, 2004·51 cites·7 claims
- 0253US7385196B2Method and scanning electron microscope for measuring width of material on sampleHITACHI HIGH TECH CORP·Filed 2004·Granted Jun 10, 2008·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →