Inventor · disambiguated record
Tetsuya Ozawa
Also filed as: OZAWA TETSUYA
32 granted patents·7 pending applications·202 citations·filing 1995–2022
96Inventor score
Top patents by PatentIndex Score
39 records- 0190US9336917B2X-ray apparatus, method of using the same and X-ray irradiation methodOZAWA TETSUYA·Filed 2010·Granted May 10, 2016·12 cites·12 claims
- 0282US12174131B2Quantitative analysis apparatus, method and program and manufacturing control systemRIGAKU DENKI CO LTD·Filed 2022·Granted Dec 24, 2024·1 cites·11 claims
- 0382US11942231B2Airtight box for measurement, airtight apparatus, measurement system and measurement apparatusRIGAKU DENKI CO LTD·Filed 2020·Granted Mar 26, 2024·1 cites·15 claims
- 0482US10436723B2X-ray diffractometer with multilayer reflection-type monochromatorRIGAKU DENKI CO LTD·Filed 2015·Granted Oct 8, 2019·2 cites·12 claims
- 0578US9074992B2X-ray diffraction apparatus and X-ray diffraction measurement methodOZAWA TETSUYA·Filed 2011·Granted Jul 7, 2015·3 cites·16 claims
- 0678US7860217B2X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the sameRIGAKU DENKI CO LTD·Filed 2008·Granted Dec 28, 2010·6 cites·14 claims
- 0778US5945011AControl apparatus for welding robot and method of teaching welding robotHONDA MOTOR CO LTD·Filed 1997·Granted Aug 31, 1999·39 cites·15 claims
- 0875US9618461B2X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted Apr 11, 2017·5 cites·10 claims
- 0975US7684543B2X-ray beam conditioning device and X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2006·Granted Mar 23, 2010·10 cites·20 claims
- 1075US7120227B2Method of displaying dynamically scattering vector of X-ray diffractionRIGAKU DENKI CO LTD·Filed 2004·Granted Oct 10, 2006·13 cites·7 claims
- 1175US6999557B2Method of setting measuring range of reciprocal-space mappingRIGAKU DENKI CO LTD·Filed 2004·Granted Feb 14, 2006·13 cites·6 claims
- 1272US6385281B1Fluorescent x-ray analyzing method and apprartusRIGAKU DENKI CO LTD·Filed 2000·Granted May 7, 2002·10 cites·20 claims
- 1371US10854348B2X-ray generator and x-ray analysis deviceRIGAKU DENKI CO LTD·Filed 2019·Granted Dec 1, 2020·2 cites·5 claims
- 1471US7266433B2Data recording apparatus for vehicleCALSONIC KANSEI CORP·Filed 2006·Granted Sep 4, 2007·6 cites·16 claims
- 1570US8991641B2Pressure vessel and method of manufacturing the sameOZAWA TETSUYA·Filed 2011·Granted Mar 31, 2015·2 cites·2 claims
- 1667US12287301B2Correction amount specifying apparatus, method, program, and jigRIGAKU DENKI CO LTD·Filed 2022·Granted Apr 29, 2025·0 cites·12 claims
- 1763US7011260B2Raw garbage treatment apparatus and a cutter thereofIZUMI PROD CO·Filed 2004·Granted Mar 14, 2006·6 cites·9 claims
- 1862US12454149B2Wheel and manufacturing method of wheelHONDA MOTOR CO LTD·Filed 2022·Granted Oct 28, 2025·0 cites·20 claims
- 1962US6212776B1Electric shaverIZUMA PRODUCTS COMPANY·Filed 1997·Granted Apr 10, 2001·36 cites·12 claims
- 2060US7337098B2Diffraction condition simulation device, diffraction measurement system, and crystal analysis systemRIGAKU DENKI CO LTD·Filed 2002·Granted Feb 26, 2008·4 cites·21 claims
- 2159US8024067B2Working stationHONDA MOTOR CO LTD·Filed 2006·Granted Sep 20, 2011·4 cites·2 claims
- 2257US8319976B2Three-dimensional shape measuring system and three-dimensional shape measuring methodKAWAI YASUHIRO·Filed 2010·Granted Nov 27, 2012·1 cites·18 claims
- 2355US9490038B2X-ray optical component device and X-ray analyzerRIGAKU DENKI CO LTD·Filed 2013·Granted Nov 8, 2016·1 cites·9 claims
- 2455US7896392B2Airbag deployment controller and passenger protection device including the sameCALSONIC KANSEI CORP·Filed 2008·Granted Mar 1, 2011·4 cites·2 claims
- 2555US2024167968A1Radiation measurement apparatusRIGAKU DENKI CO LTD·Filed 2021·Application pending·0 cites
- 2654US12405390B2Control apparatus, system, method, and programRIGAKU DENKI CO LTD·Filed 2020·Granted Sep 2, 2025·0 cites·16 claims
- 2754US12175173B2Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis programRIGAKU DENKI CO LTD·Filed 2020·Granted Dec 24, 2024·0 cites·4 claims
- 2852US11215571B2X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2020·Granted Jan 4, 2022·0 cites·3 claims
- 2948US5564191AElectric shaverIZUMI PROD CO·Filed 1995·Granted Oct 15, 1996·21 cites·6 claims
- 3047US10900913B2X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2017·Granted Jan 26, 2021·0 cites·6 claims
- 3143US2001023559A1Process for making brick-faced construction material and brick-faced block made by this processTOYO EXTERIOR CO LTD·Filed 2001·Application pending·0 cites
- 3242US10556297B2Welded section examining deviceHONDA MOTOR CO LTD·Filed 2018·Granted Feb 11, 2020·0 cites·9 claims
- 3341US9166360B2Laser light source apparatusUSHIO ELECTRIC INC·Filed 2014·Granted Oct 20, 2015·0 cites·9 claims
- 3441US2007112458A1Assist transportation method and its deviceHONDA MOTOR CO LTD·Filed 2004·Application pending·0 cites
- 3540US7558656B2Vehicle data recording deviceCALSONIC KANSEI CORP·Filed 2006·Granted Jul 7, 2009·0 cites·10 claims
- 3638US2010004783A1System For Collaboration Between Device and PersonHONDA MOTOR CO LTD·Filed 2005·Application pending·0 cites
- 3734US2010222909A1Collaboration work systemOHTAKE YOSHITO·Filed 2006·Application pending·0 cites
- 3834US2009133240A1Conveying and assembling systemSHIBAYAMA TAKAO·Filed 2005·Application pending·0 cites
- 3933US2009199385A1Parts conveying/mounting method, and its deviceMARUO MASARU·Filed 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Tetsuya Ozawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →