Inventor · disambiguated record
Tetsuhiro Tanaka
Also filed as: TANAKA TETSUHIRO
136 granted patents·21 pending applications·1,355 citations·filing 1995–2025
99Inventor score
Files withSEMICONDUCTOR ENERGY LAB116SAMSUNG DISPLAY CO LTD18TANAKA TETSUHIRO9ICHIJO MITSUHIRO3TAJIMA RYOTA2
Top patents by PatentIndex Score
157 records- 0198US9502434B2Semiconductor device and electronic deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Nov 22, 2016·29 cites·18 claims
- 0298US8324699B2Method for manufacturing semiconductor deviceICHIJO MITSUHIRO·Filed 2010·Granted Dec 4, 2012·397 cites·7 claims
- 0398US7955995B2Nonvolatile semiconductor memory device and manufacturing method thereof, semiconductor device and manufacturing method thereof, and manufacturing method of insulating filmSEMICONDUCTOR ENERGY LAB·Filed 2007·Granted Jun 7, 2011·92 cites·13 claims
- 0497US11856823B2Display panel including gate lines on opposite sides of a shielding pattern, and display device including the sameSAMSUNG DISPLAY CO LTD·Filed 2021·Granted Dec 26, 2023·3 cites·20 claims
- 0597US9887295B2Thin film transistor with multiple oxide semiconductor layersSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Feb 6, 2018·16 cites·15 claims
- 0697US9698277B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Jul 4, 2017·16 cites·42 claims
- 0797US9455349B2Oxide semiconductor thin film transistor with reduced impurity diffusionSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Sep 27, 2016·27 cites·26 claims
- 0897US9397153B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jul 19, 2016·29 cites·42 claims
- 0997US9153436B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Oct 6, 2015·33 cites·14 claims
- 1096US10672913B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2018·Granted Jun 2, 2020·8 cites·20 claims
- 1196US10290745B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted May 14, 2019·13 cites·14 claims
- 1296US9231111B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jan 5, 2016·24 cites·14 claims
- 1396US9166021B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Oct 20, 2015·23 cites·22 claims
- 1496US8772771B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Jul 8, 2014·24 cites·19 claims
- 1595US10374097B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2018·Granted Aug 6, 2019·10 cites·14 claims
- 1695US10103271B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2018·Granted Oct 16, 2018·9 cites·14 claims
- 1795US10050132B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted Aug 14, 2018·9 cites·17 claims
- 1895US9653613B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted May 16, 2017·13 cites·23 claims
- 1995US9472678B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Oct 18, 2016·19 cites·19 claims
- 2095US9412877B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Aug 9, 2016·21 cites·12 claims
- 2195US9373711B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jun 21, 2016·17 cites·37 claims
- 2295US9287117B2Semiconductor device comprising an oxide semiconductorSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Mar 15, 2016·21 cites·20 claims
- 2395US9190527B2Semiconductor device and manufacturing method of semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Nov 17, 2015·18 cites·15 claims
- 2494US10944014B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2019·Granted Mar 9, 2021·7 cites·7 claims
- 2594US9496411B2Manufacturing method of semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Nov 15, 2016·10 cites·16 claims
- 2694US9349849B2Semiconductor device and electronic device including the semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted May 24, 2016·15 cites·20 claims
- 2793US9882059B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jan 30, 2018·12 cites·30 claims
- 2893US9722056B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Aug 1, 2017·7 cites·14 claims
- 2993US9496376B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Nov 15, 2016·10 cites·15 claims
- 3093US9478664B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Oct 25, 2016·11 cites·14 claims
- 3193US9391096B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jul 12, 2016·15 cites·40 claims
- 3292US10192995B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Jan 29, 2019·8 cites·28 claims
- 3392US9917209B2Manufacturing method of semiconductor device including step of forming trench over semiconductorSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Mar 13, 2018·6 cites·10 claims
- 3492US9263259B2Semiconductor device comprising an oxide semiconductorSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Feb 16, 2016·10 cites·25 claims
- 3592US5569455AExhaust gas catalytic purifier constructionSHIMADZU CORP·Filed 1995·Granted Oct 29, 1996·150 cites·22 claims
- 3691US10553690B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Feb 4, 2020·7 cites·14 claims
- 3791US10056497B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Aug 21, 2018·5 cites·12 claims
- 3891US8981370B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Mar 17, 2015·13 cites·14 claims
- 3990US9330909B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted May 3, 2016·8 cites·18 claims
- 4090US7855153B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2009·Granted Dec 21, 2010·12 cites·23 claims
- 4189US9852904B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Dec 26, 2017·5 cites·8 claims
- 4289US9647125B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted May 9, 2017·10 cites·22 claims
- 4389US9449853B2Method for manufacturing semiconductor device comprising electron trap layerSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Sep 20, 2016·7 cites·14 claims
- 4489US2025063762A1Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2024·Application pending·0 cites
- 4588US11404585B2Semiconductor device and method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2018·Granted Aug 2, 2022·4 cites·20 claims
- 4688US9437594B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Sep 6, 2016·7 cites·17 claims
- 4788US9048321B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2012·Granted Jun 2, 2015·8 cites·6 claims
- 4887US2025120126A1Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2024·Application pending·0 cites
- 4986US2025301710A1Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2025·Application pending·0 cites
- 5085US12389636B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2023·Granted Aug 12, 2025·0 cites·15 claims
Showing the top 50 of 157 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →