Inventor · disambiguated record
Tetsuya Watanabe
Also filed as: WATANABE TETSUYA
218 granted patents·57 pending applications·2,639 citations·filing 1974–2025
99Inventor score
Files withFUJIFILM CORP55HITACHI LTD22DENSO CORP17HITACHI HIGH TECH CORP13MITSUBISHI ELECTRIC CORP12
Top patents by PatentIndex Score
275 records- 0197US7098055B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 29, 2006·36 cites·7 claims
- 0296US9618665B2Colored composition, cured film, color filter, method for producing color filter, solid-state image sensor, and image display deviceFUJIFILM CORP·Filed 2016·Granted Apr 11, 2017·10 cites·36 claims
- 0396US7639350B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Dec 29, 2009·25 cites·20 claims
- 0496US6411377B1Optical apparatus for defect and particle size inspectionHITACHI LTD·Filed 1999·Granted Jun 25, 2002·174 cites·29 claims
- 0595US12283865B2Electric motor and manufacturing method thereofMITSUBA CORP·Filed 2022·Granted Apr 22, 2025·2 cites·8 claims
- 0695US6797975B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2001·Granted Sep 28, 2004·56 cites·6 claims
- 0794US7061602B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 13, 2006·18 cites·13 claims
- 0893US7991220B2Augmented reality game system using identification information to display a virtual object in association with a position of a real objectSONY COMPUTER ENTERTAINMENT INC·Filed 2005·Granted Aug 2, 2011·53 cites·26 claims
- 0993US7443496B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Oct 28, 2008·16 cites·15 claims
- 1093US7315366B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2007·Granted Jan 1, 2008·17 cites·5 claims
- 1192US7037735B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2002·Granted May 2, 2006·43 cites·18 claims
- 1292US6859823B1Workflow server and workflow system control methodHITACHI LTD·Filed 2000·Granted Feb 22, 2005·93 cites·9 claims
- 1392US6463734B1Exhaust emission control device of internal combustion engineMITSUBISHI MOTORS CORP·Filed 2000·Granted Oct 15, 2002·54 cites·5 claims
- 1491US10819307B2Crystal unit and manufacturing method thereofNIHON DEMPA KOGYO CO·Filed 2018·Granted Oct 27, 2020·7 cites·3 claims
- 1591US7692779B2Apparatus and method for testing defectsHITACHI LTD·Filed 2005·Granted Apr 6, 2010·12 cites·20 claims
- 1691US7417723B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2006·Granted Aug 26, 2008·10 cites·12 claims
- 1791US7262425B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 28, 2007·13 cites·18 claims
- 1891US6936835B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI LTD·Filed 2002·Granted Aug 30, 2005·34 cites·22 claims
- 1990US9546736B2Trunnion ball valve for high pressure, and hydrogen stationKITZ CORP·Filed 2013·Granted Jan 17, 2017·9 cites·16 claims
- 2090US6888959B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI HIGH TECH ELECT ENG CO·Filed 2001·Granted May 3, 2005·38 cites·20 claims
- 2188US6597448B1Apparatus and method of inspecting foreign particle or defect on a sampleHITACHI LTD·Filed 2000·Granted Jul 22, 2003·44 cites·20 claims
- 2287US11655898B2Cryogenic globe valveKITZ CORP·Filed 2019·Granted May 23, 2023·5 cites·12 claims
- 2387US9620602B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Apr 11, 2017·5 cites·7 claims
- 2487US7187438B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2002·Granted Mar 6, 2007·25 cites·24 claims
- 2587US5694214ASurface inspection method and apparatusHITACHI ELECTR ENG·Filed 1996·Granted Dec 2, 1997·86 cites·9 claims
- 2686US11162574B2Speed reduction mechanism and motor with speed reducerMITSUBA CORP·Filed 2018·Granted Nov 2, 2021·3 cites·5 claims
- 2786US10088459B2Liquid mixing device, and liquid chromatography apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 2, 2018·8 cites·6 claims
- 2886US8274651B2Method of inspecting a semiconductor device and an apparatus thereofHAMAMATSU AKIRA·Filed 2011·Granted Sep 25, 2012·3 cites·14 claims
- 2986US7115892B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 3, 2006·7 cites·5 claims
- 3086US4841775AVibratory transducerYOKOGAWA ELECTRIC CORP·Filed 1988·Granted Jun 27, 1989·86 cites·24 claims
- 3185US7643138B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2008·Granted Jan 5, 2010·5 cites·12 claims
- 3285US7511806B2Apparatus and method for inspecting defectsHITACHI LTD·Filed 2007·Granted Mar 31, 2009·7 cites·18 claims
- 3385US6002989ASystem for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss valueHITACHI LTD·Filed 1997·Granted Dec 14, 1999·84 cites·25 claims
- 3484US6763659B2Exhaust emission control device for internal combustion engineMITSUBISHI MOTORS CORP·Filed 2003·Granted Jul 20, 2004·49 cites·7 claims
- 3583US9390349B2Display control of objects on a displayFUJI XEROX CO LTD·Filed 2015·Granted Jul 12, 2016·5 cites·18 claims
- 3683US8329008B2Gas generating device and carbon electrode for gas generationMAEKAWA HIROSHI·Filed 2008·Granted Dec 11, 2012·7 cites·12 claims
- 3783US7364027B2Belt-type continuously-variable transmissionJATCO LTD·Filed 2005·Granted Apr 29, 2008·11 cites·20 claims
- 3883US7256412B2Method and its apparatus for inspecting particles or defects of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Aug 14, 2007·5 cites·6 claims
- 3983US4966649AProcess for manufacturing a vibrating type transducerYOKOGAWA ELECTRIC CORP·Filed 1989·Granted Oct 30, 1990·39 cites·16 claims
- 4083US4087372AAn absorbing solution for the removal of nitrogen oxide form a gas containing sameKUREHA CHEMICAL IND CO LTD·Filed 1976·Granted May 2, 1978·38 cites·4 claims
- 4182US10629818B2Organic thin-film transistor and method for manufacturing the same, material for organic thin-film transistor, composition for organic thin-film transistor, compound, and organic semiconductor filmFUJIFILM CORP·Filed 2018·Granted Apr 21, 2020·2 cites·18 claims
- 4282US10283719B2Organic thin-film transistor and method for manufacturing the same, material for organic thin-film transistor, composition for organic thin-film transistor, compound, and organic semiconductor filmFUJIFILM CORP·Filed 2018·Granted May 7, 2019·2 cites·22 claims
- 4382US8040503B2Method of inspecting a semiconductor device and an apparatus thereofHITACHI LTD·Filed 2010·Granted Oct 18, 2011·2 cites·12 claims
- 4482US7499157B2System for monitoring foreign particles, process processing apparatus and method of electronic commerceHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 3, 2009·5 cites·3 claims
- 4582US7196785B2System for monitoring foreign particles, process processing apparatus and method of electronic commerceHITACHI HIGH TECH CORP·Filed 2003·Granted Mar 27, 2007·15 cites·14 claims
- 4682US7090222B2Shaft sealing assembly for vacuum processing apparatusTEIJIN SEIKI CO LTD·Filed 2001·Granted Aug 15, 2006·25 cites·20 claims
- 4782US7055825B2Shaft sealing apparatusTEIJIN SEIKI CO LTD·Filed 2003·Granted Jun 6, 2006·25 cites·5 claims
- 4882US6705177B2Robot arm mechanismTEIJIN SEIKI CO LTD·Filed 2002·Granted Mar 16, 2004·30 cites·21 claims
- 4981US10312447B2Organic semiconductor element, manufacturing method thereof, compound, organic semiconductor composition, organic semiconductor film, and manufacturing method thereofFUJIFILM CORP·Filed 2017·Granted Jun 4, 2019·1 cites·18 claims
- 5081US7230435B2Capacitance measurement circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jun 12, 2007·25 cites·8 claims
Showing the top 50 of 275 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →