Inventor · disambiguated record
Thorsten Bucksch
Also filed as: BUCKSCH THORSTEN
17 granted patents·7 pending applications·125 citations·filing 2001–2024
92Inventor score
Top patents by PatentIndex Score
24 records- 0184US7180313B2Test device for wafer testing digital semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 20, 2007·44 cites·8 claims
- 0281US7330378B2Inputting and outputting operating parameters for an integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·15 cites·12 claims
- 0378US7421629B2Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedureINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 2, 2008·12 cites·16 claims
- 0476US7323861B2Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plateINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 29, 2008·9 cites·14 claims
- 0573US7375508B2Device and a process for the calibration of a semiconductor component test systemINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 20, 2008·8 cites·9 claims
- 0661US7415649B2Semi-conductor component test device with shift register, and semi-conductor component test procedureINFINEON TECHNOLOGIES AG·Filed 2005·Granted Aug 19, 2008·5 cites·16 claims
- 0761US7184339B2Semi-conductor component, as well as a process for the in-or output of test dataINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 27, 2007·5 cites·10 claims
- 0858US7061260B2Calibration device for the calibration of a tester channel of a tester device and a test systemINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 13, 2006·10 cites·17 claims
- 0953US11556097B2Neural network circuitry for motors with first plurality of neurons and second plurality of neuronsINFINEON TECHNOLOGIES AG·Filed 2020·Granted Jan 17, 2023·0 cites·20 claims
- 1050US7715257B2Test method and semiconductor deviceQIMONDA AG·Filed 2007·Granted May 11, 2010·1 cites·20 claims
- 1150US6898739B2Method and device for testing a memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 24, 2005·7 cites·15 claims
- 1246US2025300585A1Shuntless motor control for multi-phase motorsINFINEON TECHNOLOGIES AG·Filed 2024·Application pending·0 cites
- 1345US11456646B2Neural network circuitry for motorsINFINEON TECHNOLOGIES AG·Filed 2020·Granted Sep 27, 2022·0 cites·18 claims
- 1443US6754869B2Method and device for testing set-up time and hold time of signals of a circuit with clocked data transferINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 22, 2004·4 cites·8 claims
- 1542US7061227B2Apparatus and method for calibrating a semiconductor test systemINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 13, 2006·5 cites·10 claims
- 1640US10438680B2Non-volatile memory testingINFINEON TECHNOLOGIES AG·Filed 2017·Granted Oct 8, 2019·0 cites·20 claims
- 1737US2007236239A1Integrated circuit having a semiconductor device and integrated circut test methodQIMONDA AG·Filed 2007·Application pending·0 cites
- 1836US6750670B2Integrated test circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 15, 2004·0 cites·18 claims
- 1935US7317323B2Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor componentsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jan 8, 2008·0 cites·19 claims
- 2033US2007280016A1Semiconductor device and method for operating a semiconductor deviceQIMONDA AG·Filed 2007·Application pending·0 cites
- 2132US2006126408A1Memory bufferINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2231US2005254324A1Semi-conductor component test procedure, as well as a data buffer componentINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2331US2005273679A1Semi-conductor component test procedure, in particular for a system with several modules, each comprising a data buffer component, as well as a test module to be used in a corresponding procedureINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2431US2006156081A1Semiconductor component test procedure, as well as a data buffer componentINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →