Inventor · disambiguated record
Thierry Canaud
Also filed as: CANAUD THIERRY
1 granted patent·1 pending application·20 citations·filing 2003–2004
40Inventor score
Files withINFINEON TECHNOLOGIES AG1
Top patents by PatentIndex Score
2 records- 0171US7088122B2Test arrangement for testing semiconductor circuit chipsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 8, 2006·20 cites·20 claims
- 0213US2004052149A1Integrated microcontroller module and method for checking the functionality of an integrated memory of the microcontroller moduleFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →