Inventor · disambiguated record
Thomas Hingst
Also filed as: HINGST THOMAS
1 granted patent·1 pending application·0 citations·filing 2005–2005
5Inventor score
Files withINFINEON TECHNOLOGIES AG2
Top patents by PatentIndex Score
2 records- 0137US2005239223A1Method and device for monitoring the etching operation for a regular depth structure in a semiconductor substrateINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 0225US7230241B2Method for matching two measurement methods for measuring structure widths on a substrateINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 12, 2007·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →