Inventor · disambiguated record
Thijs C. Hosman
Also filed as: HOSMAN THIJS C
2 granted patents·2 pending applications·0 citations·filing 2015–2021
21Inventor score
Files withGATAN INC4
Top patents by PatentIndex Score
4 records- 0155US2023373028A1Apparatus and method for semiconductor package failure analysisGATAN INC·Filed 2021·Application pending·0 cites
- 0245US2023311244A1Apparatus and method for semiconductor package failure analysisGATAN INC·Filed 2021·Application pending·0 cites
- 0339US11004656B2Methods and apparatus for determining, using, and indicating ion beam working propertiesGATAN INC·Filed 2015·Granted May 11, 2021·0 cites·15 claims
- 0430US10731246B2Ion beam sample preparation and coating apparatus and methodsGATAN INC·Filed 2015·Granted Aug 4, 2020·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →