Inventor · disambiguated record
Thomas F. Kent
Also filed as: KENT THOMAS · KENT THOMAS F
12 granted patents·7 pending applications·12 citations·filing 2014–2025
85Inventor score
Top patents by PatentIndex Score
19 records- 0188US11906578B2System and method for rapid inspection of printed circuit board using multiple modalitiesBATTELLE MEMORIAL INSTITUTE·Filed 2020·Granted Feb 20, 2024·3 cites·24 claims
- 0288US11756157B2Multimodal inspection systemBATTELLE MEMORIAL INSTITUTE·Filed 2021·Granted Sep 12, 2023·2 cites·20 claims
- 0384US11315840B2Assembly and method for performing in-situ endpoint detection when backside milling silicon based devicesBATTELLE MEMORIAL INSTITUTE·Filed 2020·Granted Apr 26, 2022·2 cites·19 claims
- 0481US12339317B2Systems and methods for precise signal injection into microelectronic devicesBATTELLE MEMORIAL INSTITUTE·Filed 2024·Granted Jun 24, 2025·0 cites·13 claims
- 0579US2025290977A1Systems and methods for precise signal injection into microelectronic devicesBATTELLE MEMORIAL INSTITUTE·Filed 2025·Application pending·0 cites
- 0676US2025086751A1Multimodal inspection systemBATTELLE MEMORIAL INSTITUTE·Filed 2024·Application pending·0 cites
- 0774US12154249B2Multimodal inspection systemBATTELLE MEMORIAL INSTITUTE·Filed 2023·Granted Nov 26, 2024·0 cites·20 claims
- 0872US11022575B1Systems and methods for measuring unique microelectronic electromagnetic signaturesAPPLIED RES ASSOCIATES INC·Filed 2018·Granted Jun 1, 2021·3 cites·19 claims
- 0971US11899060B2Systems and methods for precise signal injection into microelectronic devicesBATTELLE MEMORIAL INSTITUTE·Filed 2022·Granted Feb 13, 2024·0 cites·16 claims
- 1071US2025272785A1High resolution imaging of microelectronic devicesBATTELLE MEMORIAL INSTITUTE·Filed 2025·Application pending·0 cites
- 1171US2024142516A1System and method for rapid inspection of printed circuit board using multiple modalitiesBATTELLE MEMORIAL INSTITUTE·Filed 2024·Application pending·0 cites
- 1268US12444658B2Assembly and method for performing in-situ endpoint detection when backside milling silicon based devicesBATTELLE MEMORIAL INSTITUTE·Filed 2022·Granted Oct 14, 2025·0 cites·14 claims
- 1367US9368676B2Gd doped AlGaN ultraviolet light emitting diodeMYERS ROBERTO C·Filed 2014·Granted Jun 14, 2016·2 cites·19 claims
- 1467US2025199061A1Method of Identifying Vulnerable Regions in an Integrated CircuitBATTELLE MEMORIAL INSTITUTE·Filed 2025·Application pending·0 cites
- 1565US12315105B2High resolution imaging of microelectronic devicesBATTELLE MEMORIAL INSTITUTE·Filed 2022·Granted May 27, 2025·0 cites·20 claims
- 1663US12298343B2Method of identifying vulnerable regions in an integrated circuitBATTELLE MEMORIAL INSTITUTE·Filed 2021·Granted May 13, 2025·0 cites·19 claims
- 1759US12416593B1Systems and methods for measuring unique microelectronic electromagnetic signaturesAPPLIED RES ASSOCIATES INC·Filed 2021·Granted Sep 16, 2025·0 cites·20 claims
- 1853US2024233407A9Systems and methods for printed circuit board netlist extraction from multimodal imageryBATTELLE MEMORIAL INSTITUTE·Filed 2023·Application pending·0 cites
- 1951US2023377127A1Non-destructive verification of integrated circuitsBATTELLE MEMORIAL INSTITUTE·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →