Inventor · disambiguated record

Thomas Yun Fook Liew

Also filed as: LIEW THOMAS YUN FOOK

2 granted patents·28 citations·filing 1999–2000

61Inventor score

Technology areasG01R

Files withINST DATA STORAGE2

Top patents by PatentIndex Score

2 records

0162US6366081B1Method and apparatus for high throughput media defect testing using true reference valueINST DATA STORAGE·Filed 2000·Granted Apr 2, 2002·17 cites·38 claims
0238US6201390B1Defect analysis in magnetic thin filmsINST DATA STORAGE·Filed 1999·Granted Mar 13, 2001·11 cites·14 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →