Inventor · disambiguated record
Thomas M. Moore
Also filed as: MOORE THOMAS · MOORE THOMAS M
38 granted patents·4 pending applications·767 citations·filing 1977–2024
98Inventor score
Top patents by PatentIndex Score
42 records- 0197US7115882B2TEM sample holderOMNIPROBE INC·Filed 2006·Granted Oct 3, 2006·26 cites·31 claims
- 0296US6570170B2Total release method for sample extraction from a charged-particle instrumentOMNIPROBE INC·Filed 2002·Granted May 27, 2003·93 cites·17 claims
- 0395US7414252B2Method and apparatus for the automated process of in-situ lift-outOMNIPROBE INC·Filed 2005·Granted Aug 19, 2008·34 cites·65 claims
- 0495US6420722B2Method for sample separation and lift-out with one cutOMNIPROBE INC·Filed 2001·Granted Jul 16, 2002·179 cites·16 claims
- 0594US7126133B2Kit for preparing a tem sample holderOMNIPROBE INC·Filed 2006·Granted Oct 24, 2006·23 cites·15 claims
- 0693US8227781B2Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrumentZAYKOVA-FELDMAN LYUDMILA·Filed 2010·Granted Jul 24, 2012·25 cites·8 claims
- 0793US7315023B2Method of preparing a sample for examination in a TEMOMNIPROBE INC·Filed 2006·Granted Jan 1, 2008·13 cites·31 claims
- 0892US7395727B2Strain detection for automated nano-manipulationOMNIPROBE INC·Filed 2005·Granted Jul 8, 2008·17 cites·9 claims
- 0991US7381971B2Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscopeOMNIPROBE INC·Filed 2005·Granted Jun 3, 2008·36 cites·40 claims
- 1091US7126132B2Apparatus for preparing a TEM sample holderOMNIPROBE INC·Filed 2006·Granted Oct 24, 2006·16 cites·6 claims
- 1189US8440969B2Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam imagesMOORE THOMAS M·Filed 2011·Granted May 14, 2013·14 cites·30 claims
- 1287US7834315B2Method for STEM sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2008·Granted Nov 16, 2010·8 cites·12 claims
- 1387US7785233B1Collapsible hurdle with quick resetMOORE THOMAS M·Filed 2008·Granted Aug 31, 2010·23 cites·16 claims
- 1486US8247768B2Method for stem sample inspection in a charged particle beam instrumentZAYKOVA-FELDMAN LYUDMILA·Filed 2010·Granted Aug 21, 2012·6 cites·8 claims
- 1585US6777674B2Method for manipulating microscopic particles and analyzingOMNIPROBE INC·Filed 2002·Granted Aug 17, 2004·25 cites·65 claims
- 1684US7644637B2Method and apparatus for transfer of samples in a controlled environmentOMNIPROBE INC·Filed 2007·Granted Jan 12, 2010·20 cites·25 claims
- 1784US4622836ALoft and lie calibration machineMACGREGOR GOLF CO·Filed 1985·Granted Nov 18, 1986·33 cites·6 claims
- 1883US7208724B2Apparatus and method of detecting probe tip contact with a surfaceOMNIPROBE INC·Filed 2005·Granted Apr 24, 2007·8 cites·18 claims
- 1982US8394454B2Method and apparatus for precursor delivery system for irradiation beam instrumentsKRUGER ROCKY·Filed 2009·Granted Mar 12, 2013·5 cites·8 claims
- 2080US7053383B2Method and apparatus for rapid sample preparation in a focused ion beam microscopeOMNIPROBE INC·Filed 2004·Granted May 30, 2006·13 cites·8 claims
- 2180US6435398B2Method for chemically reworking metal layers on integrated circuit bond padsTEXAS INSTRUMENTS INC·Filed 2001·Granted Aug 20, 2002·23 cites·14 claims
- 2279US7935937B2Method of forming TEM sample holderOMNIPROBE IN C·Filed 2009·Granted May 3, 2011·7 cites·30 claims
- 2378US7961397B2Single-channel optical processing system for energetic-beam microscopesOMNIPROBE INC·Filed 2008·Granted Jun 14, 2011·5 cites·40 claims
- 2475US8512474B2Apparatus for precursor delivery system for irradiation beam instrumentsKRUGER ROCKY·Filed 2012·Granted Aug 20, 2013·1 cites·7 claims
- 2569US8168949B2Method for stem sample inspection in a charged particle beam instrumentZAYKOVA-FELDMAN LYUDMILA·Filed 2010·Granted May 1, 2012·1 cites·5 claims
- 2668US11169029B2Coaxial fiber optical pyrometer with laser sample heaterWAVIKS INC·Filed 2019·Granted Nov 9, 2021·1 cites·10 claims
- 2768US4040577ALockwood airfoil used in conjunction with man transport deviceUS ARMY·Filed 1977·Granted Aug 9, 1977·29 cites·4 claims
- 2867US7446542B2Apparatus and method for automated stress testing of flip-chip packagesOMNIPROBE INC·Filed 2006·Granted Nov 4, 2008·2 cites·7 claims
- 2965US5641906AApparatus and method for automated non-destructive inspection of integrated circuit packagesTEXAS INSTRUMENTS INC·Filed 1995·Granted Jun 24, 1997·24 cites·3 claims
- 3064USRE46350EMethod for stem sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2014·Granted Mar 28, 2017·0 cites·10 claims
- 3162US5046363AApparatus for rapid non-destructive measurement of die attach quality in packaged integrated circuitsTEXAS INSTRUMENTS INC·Filed 1989·Granted Sep 10, 1991·20 cites·29 claims
- 3261US5627320AApparatus and method for automated non-destructive inspection of integrated circuit packagesTEXAS INSTRUMENTS INC·Filed 1995·Granted May 6, 1997·21 cites·2 claims
- 3361US2025379025A1Optical Probe System for the Electron MicroscopeWAVIKS INC·Filed 2024·Application pending·0 cites
- 3457US6561868B1System and method for controlling a polishing machineTEXAS INSTRUMENTS INC·Filed 2000·Granted May 13, 2003·8 cites·20 claims
- 3556US7755372B2Method for automated stress testing of flip-chip packagesOMNIPROBE INC·Filed 2008·Granted Jul 13, 2010·0 cites·10 claims
- 3656US2010068408A1Methods for electron-beam induced deposition of material inside energetic-beam microscopesOMNIPROBE INC·Filed 2008·Application pending·0 cites
- 3755US6534327B2Method for reworking metal layers on integrated circuit bond padsTEXAS INSTRUMENTS INC·Filed 2001·Granted Mar 18, 2003·6 cites·20 claims
- 3852US2006219919A1TEM sample holder and method of forming sameMOORE THOMAS M·Filed 2006·Application pending·0 cites
- 3948US10176963B2Method and apparatus for alignment of optical and charged-particle beams in an electron microscopeWAVIKS INC·Filed 2017·Granted Jan 8, 2019·0 cites·41 claims
- 4047US6821791B2Method for reworking metal layers on integrated circuit bond padsTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 23, 2004·2 cites·20 claims
- 4145US2010200546A1Method of etching materials with electron beam and laser energyOMNIPROBE INC·Filed 2010·Application pending·0 cites
- 4240US8759765B2Method for processing samples held by a nanomanipulatorHARTFIELD CHERYL D·Filed 2012·Granted Jun 24, 2014·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →