Inventor · disambiguated record
Thomas Obrien
Also filed as: O'BRIEN THOMAS · O'BRIEN THOMAS J · OBRIEN THOMAS
5 granted patents·7 pending applications·20 citations·filing 2001–2024
76Inventor score
Top patents by PatentIndex Score
12 records- 0182US10132738B2Optical platelet counter methodFOCE TECH INTERNATIONAL BV·Filed 2017·Granted Nov 20, 2018·4 cites·13 claims
- 0280US9690974B2Optical platelet counter methodFOCE TECH INT BV·Filed 2014·Granted Jun 27, 2017·7 cites·11 claims
- 0360US7139991B2Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designsLSI LOGIC CORP·Filed 2005·Granted Nov 21, 2006·4 cites·14 claims
- 0455US2024421201A1Trench connection over disconnected epitaxial structure using directed self-assemblyINTEL CORP·Filed 2023·Application pending·0 cites
- 0555US2025393252A1Integrated circuit structures having uniform grid metal gate and trench contact placeholder cut with direct patterned trench contactINTEL CORP·Filed 2024·Application pending·0 cites
- 0654US2025311328A1Integrated circuit structures having uniform grid metal gate and trench contact placeholder cutINTEL CORP·Filed 2024·Application pending·0 cites
- 0754US2025004704A1Operating an electronic deviceB&W GROUP LTD·Filed 2024·Application pending·0 cites
- 0852US2025107195A1Integrated circuit structures with trench contact flyover structureINTEL CORP·Filed 2023·Application pending·0 cites
- 0949US12074518B2Multi-phase switching converter under a phase-added operation and control method thereofMONOLITHIC POWER SYSTEMS INC·Filed 2022·Granted Aug 27, 2024·0 cites·20 claims
- 1049US2024321978A1Contact extended over an adjacent source or drain regionINTEL CORP·Filed 2023·Application pending·0 cites
- 1146US6931606B1Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designsLSI LOGIC CORP·Filed 2001·Granted Aug 16, 2005·5 cites·12 claims
- 1246US2024321872A1Gate link across gate cut in semiconductor devicesINTEL CORP·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →