Inventor · disambiguated record
Thomas Rabenalt
Also filed as: RABENALT THOMAS
21 granted patents·2 pending applications·38 citations·filing 2010–2023
92Inventor score
Top patents by PatentIndex Score
23 records- 0190US11892906B2Method for memory storage and accessINFINEON TECHNOLOGIES AG·Filed 2021·Granted Feb 6, 2024·2 cites·17 claims
- 0285US8898529B2High performance compaction for test responses with many unknownsGOESSEL MICHAEL·Filed 2011·Granted Nov 25, 2014·7 cites·5 claims
- 0380US9450613B2Apparatus and method for error correction and error detectionINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 20, 2016·7 cites·25 claims
- 0477US10903859B2Error detection by means of group errorsINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jan 26, 2021·3 cites·26 claims
- 0575US9203437B2Circuitry and method for correcting 3-bit errors containing adjacent 2-bit errorKERN THOMAS·Filed 2012·Granted Dec 1, 2015·6 cites·24 claims
- 0669US10067826B2Marker programming in non-volatile memoriesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Sep 4, 2018·1 cites·11 claims
- 0768US9417957B2Method of detecting bit errors, an electronic circuit for detecting bit errors, and a data storage deviceINFINEON TECHNOLOGIES AG·Filed 2013·Granted Aug 16, 2016·2 cites·16 claims
- 0866US10200065B2Apparatus and method for correcting at least one bit error within a coded bit sequenceINFINEON TECHNOLOGIES AG·Filed 2013·Granted Feb 5, 2019·3 cites·11 claims
- 0964US9118351B2System and method for signature-based redundancy comparisonVILELA ANTONIO·Filed 2012·Granted Aug 25, 2015·3 cites·36 claims
- 1061US8856629B2Device and method for testing a circuit to be testedKERN THOMAS·Filed 2012·Granted Oct 7, 2014·1 cites·22 claims
- 1159US12273125B2Byte error correctionINFINEON TECHNOLOGIES AG·Filed 2022·Granted Apr 8, 2025·0 cites·22 claims
- 1258US12147303B2Error processing for non-volatile memoriesINFINEON TECHNOLOGIES AG·Filed 2023·Granted Nov 19, 2024·0 cites·15 claims
- 1358US8539321B2Apparatus and method for correcting at least one bit error within a coded bit sequenceKERN THOMAS·Filed 2010·Granted Sep 17, 2013·2 cites·22 claims
- 1457US10157095B2Method of using a memory device, memory device and memory device assemblyINFINEON TECHNOLOGIES AG·Filed 2017·Granted Dec 18, 2018·1 cites·21 claims
- 1556US9405618B2Marker programming in non-volatile memoriesINFINEON TECHNOLOGIES AG·Filed 2014·Granted Aug 2, 2016·0 cites·23 claims
- 1655US11262948B2Transformation of binary signals read from a memoryINFINEON TECHNOLOGIES AG·Filed 2020·Granted Mar 1, 2022·0 cites·18 claims
- 1749US8966355B2Apparatus and method for comparing pairs of binary wordsKERN THOMAS·Filed 2012·Granted Feb 24, 2015·0 cites·14 claims
- 1848US11722153B2Correction of bit errorsINFINEON TECHNOLOGIES AG·Filed 2022·Granted Aug 8, 2023·0 cites·26 claims
- 1944US2022345157A1Multibyte error detectionINFINEON TECHNOLOGIES AG·Filed 2022·Application pending·0 cites
- 2038US11068344B2Candidate bit detection and utilization for error correctionINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jul 20, 2021·0 cites·20 claims
- 2136US2011138249A1Apparatus and Method for Detecting an Error Within a Plurality of Coded Binary Words Coded by an Error Correction CodeINFINEON TECHNOLOGIES AG·Filed 2010·Application pending·0 cites
- 2233US8898535B2Apparatus and method for detecting an error within a coded binary wordKERN THOMAS·Filed 2010·Granted Nov 25, 2014·0 cites·24 claims
- 2333US8533566B2Method and apparatus for storing dataBACKHAUSEN ULRICH·Filed 2011·Granted Sep 10, 2013·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →