Inventor · disambiguated record

Thien Trieu

Also filed as: TRIEU THIEN

1 granted patent·9 citations·filing 1997–1997

31Inventor score

Technology areasG11C

Files withLSI LOGIC CORP1

Top patents by PatentIndex Score

1 record

0138US5903505AMethod of testing memory refresh operations wherein subthreshold leakage current may be set to near worst-case conditionsLSI LOGIC CORP·Filed 1997·Granted May 11, 1999·9 cites·17 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →