Inventor · disambiguated record

Thin Van Luu

Also filed as: VAN LUU THIN

1 granted patent·6 citations·filing 2008–2008

28Inventor score

Technology areasH10P

Files withVISTEC SEMICONDUCTOR SYS GMBH1

Top patents by PatentIndex Score

1 record

0167US7768637B2Method for acquiring high-resolution images of defects on the upper surface of the wafer edgeVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Granted Aug 3, 2010·6 cites·18 claims

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