Inventor · disambiguated record
Thomas Verburgt
Also filed as: VERBURGT THOMAS
6 granted patents·1 pending application·509 citations·filing 1999–2016
88Inventor score
Technology areasH10P
Files withAUGUST TECHNOLOGY CORP3O'DELL JEFFREY1O'DELL JEFFREY L1RUDOLPH TECH INC1RUDOLPH TECHNOLOGIES INC1
Top patents by PatentIndex Score
7 records- 0197US6324298B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 1999·Granted Nov 27, 2001·310 cites·26 claims
- 0294US6937753B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 2000·Granted Aug 30, 2005·96 cites·7 claims
- 0393US6826298B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 2000·Granted Nov 30, 2004·53 cites·5 claims
- 0492US9464992B2Automated wafer defect inspection system and a process of performing such inspectionRUDOLPH TECH INC·Filed 2016·Granted Oct 11, 2016·6 cites·11 claims
- 0592US7729528B2Automated wafer defect inspection system and a process of performing such inspectionRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Jun 1, 2010·43 cites·53 claims
- 0664US9337071B2Automated wafer defect inspection system and a process of performing such inspectionO'DELL JEFFREY L·Filed 2010·Granted May 10, 2016·1 cites·44 claims
- 0753US2012087569A1Automated wafer defect inspection system and a process of performing such inspectionO'DELL JEFFREY·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →