Inventor · disambiguated record
Thomas Zelder
Also filed as: ZELDER THOMAS
9 granted patents·35 citations·filing 2007–2014
85Inventor score
Top patents by PatentIndex Score
9 records- 0179US8760184B2Measuring probe for a vector network analysis systemZELDER THOMAS·Filed 2009·Granted Jun 24, 2014·11 cites·26 claims
- 0272US9470713B2Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuitROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO KG·Filed 2014·Granted Oct 18, 2016·2 cites·12 claims
- 0372US8452565B2HF measurement system, method for the calibration thereof, and method for determining scattering parameters with this HF measurement systemZELDER THOMAS·Filed 2007·Granted May 28, 2013·8 cites·14 claims
- 0462US8963570B2Contactless loop probeZELDER THOMAS·Filed 2009·Granted Feb 24, 2015·4 cites·14 claims
- 0562US8121574B2Loop-type directional couplerZELDER THOMAS·Filed 2008·Granted Feb 21, 2012·3 cites·19 claims
- 0659US8791705B2Measurement arrangement having a calibration substrate and electronic circuitZELDER THOMAS·Filed 2009·Granted Jul 29, 2014·3 cites·19 claims
- 0755US8803538B2Contactless measuring system for near field measurement of a signal waveguideZELDER THOMAS·Filed 2008·Granted Aug 12, 2014·2 cites·18 claims
- 0854US9291644B2Contactless measuring system for contactless decoupling of a signal running on a signal waveguideROSENBERGER HOCHFREQUENZTECH·Filed 2014·Granted Mar 22, 2016·0 cites·13 claims
- 0951US9116189B2Measuring system for determining scatter parametersZELDER THOMAS·Filed 2009·Granted Aug 25, 2015·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →