Inventor · disambiguated record
Tim Z. Hossain
Also filed as: HOSSAIN TIM · HOSSAIN TIM Z
29 granted patents·3 pending applications·991 citations·filing 1995–2023
98Inventor score
Top patents by PatentIndex Score
32 records- 0193US5778039AMethod and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)ADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 7, 1998·141 cites·13 claims
- 0291US5742658AApparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor waferADVANCED MICRO DEVICES INC·Filed 1996·Granted Apr 21, 1998·143 cites·28 claims
- 0389US8440357B2Fuel cell catalyst regenerationHOSSAIN TIM Z·Filed 2011·Granted May 14, 2013·19 cites·20 claims
- 0487US11846738B2Radiation detection systems and methodsCERIUM LABORATORIES LLC·Filed 2020·Granted Dec 19, 2023·3 cites·20 claims
- 0586US6067154AMethod and apparatus for the molecular identification of defects in semiconductor manufacturing using a radiation scattering technique such as raman spectroscopyADVANCED MICRO DEVICES INC·Filed 1998·Granted May 23, 2000·75 cites·15 claims
- 0679US7645993B2Arrayed neutron detector with multi shielding allowing for discrimination between radiation typesSPANSION LLC·Filed 2007·Granted Jan 12, 2010·9 cites·20 claims
- 0779US6151119AApparatus and method for determining depth profile characteristics of a dopant material in a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1997·Granted Nov 21, 2000·67 cites·22 claims
- 0879US6075261ANeutron detecting semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1997·Granted Jun 13, 2000·58 cites·25 claims
- 0977US6515367B1Sub-cap and method of manufacture therefor in integrated circuit capping layersADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 4, 2003·21 cites·14 claims
- 1077US6173036B1Depth profile metrology using grazing incidence X-ray fluorescenceADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 9, 2001·54 cites·13 claims
- 1177US5754620AApparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor waferADVANCED MICRO DEVICES INC·Filed 1996·Granted May 19, 1998·51 cites·29 claims
- 1274US6434217B1System and method for analyzing layers using x-ray transmissionADVANCED MICRO DEVICES INC·Filed 2000·Granted Aug 13, 2002·19 cites·22 claims
- 1374US5657363AMethod and apparatus for determining the thickness and elemental composition of a thin film using radioisotopic X-ray fluorescence (RXRF)ADVANCED MICRO DEVICES INC·Filed 1995·Granted Aug 12, 1997·43 cites·14 claims
- 1472US6005915AApparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photonsADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 21, 1999·42 cites·24 claims
- 1572US5913131AAlternative process for BPTEOS/BPSG layer formationADVANCED MICRO DEVICES INC·Filed 1996·Granted Jun 15, 1999·32 cites·26 claims
- 1671US6406996B1Sub-cap and method of manufacture therefor in integrated circuit capping layersADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 18, 2002·16 cites·6 claims
- 1768US5965945AGraded PB for C4 pump technologyADVANCED MICRO DEVICES INC·Filed 1998·Granted Oct 12, 1999·31 cites·38 claims
- 1868US2023268573A1Systems and methods for recovering metals from recycled electrical energy storage devicesCERIUM LABORATORIES LLC·Filed 2023·Application pending·0 cites
- 1967US6579788B1Method of forming conductive interconnections on an integrated circuit deviceADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 17, 2003·16 cites·21 claims
- 2064US6043486AAbsolute standard reference materials for low-level concentration measurementsADVANCED MICRO DEVICES INC·Filed 1999·Granted Mar 28, 2000·21 cites·25 claims
- 2159US6376267B1Scattered incident X-ray photons for measuring surface roughness of a semiconductor topographyADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 23, 2002·26 cites·19 claims
- 2258US6097079ABoron implanted dielectric structureADVANCED MICRO DEVICES INC·Filed 1999·Granted Aug 1, 2000·17 cites·20 claims
- 2357US7981825B2Fuel cell catalyst regenerationSPANSION LLC·Filed 2008·Granted Jul 19, 2011·0 cites·20 claims
- 2457US6144103AGraded PB for C4 bump technologyADVANCED MICRO DEVICES INC·Filed 1999·Granted Nov 7, 2000·19 cites·42 claims
- 2556US5866899AConcentration measurement apparatus calibration methodADVANCED MICRO DEVICES INC·Filed 1996·Granted Feb 2, 1999·16 cites·26 claims
- 2649US6242785B1Nitride based sidewall spaces for submicron MOSFETsADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 5, 2001·12 cites·12 claims
- 2748US5841016AUltra-low level standard for concentration measurementsADVANCED MICRO DEVICES INC·Filed 1996·Granted Nov 24, 1998·14 cites·34 claims
- 2846US6271112B1Interlayer between titanium nitride and high density plasma oxideADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 7, 2001·12 cites·27 claims
- 2946US2009029202A1Fuel cell using deuteriumSPANSION LLC·Filed 2007·Application pending·0 cites
- 3042US6191032B1Thin titanium film as self-regulating filter for silicon migration into aluminum metal linesADVANCED MICRO DEVICES INC·Filed 1997·Granted Feb 20, 2001·12 cites·24 claims
- 3142US2010059762A1Heat removal facilitated with diamond-like carbon layer in soi structuresSPANSION LLC·Filed 2008·Application pending·0 cites
- 3224US6156650AMethod of releasing gas trapped during depositionADVANCED MICRO DEVICES INC·Filed 1998·Granted Dec 5, 2000·2 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →