Inventor · disambiguated record
Timothy E. Neary
Also filed as: NEARY TIMOTHY E · NEARY TIMOTHY EDWARD
19 granted patents·3 pending applications·733 citations·filing 1993–2010
96Inventor score
Files withIBM22
Top patents by PatentIndex Score
22 records- 0197US6016357AFeedback method to repair phase shift masksIBM·Filed 1997·Granted Jan 18, 2000·201 cites·23 claims
- 0296US6190836B1Methods for repair of photomasksIBM·Filed 2000·Granted Feb 20, 2001·75 cites·18 claims
- 0392US7932614B2Method of thinning a semiconductor substrateIBM·Filed 2010·Granted Apr 26, 2011·12 cites·11 claims
- 0492US6165649AMethods for repair of photomasksIBM·Filed 1997·Granted Dec 26, 2000·70 cites·64 claims
- 0592US6090507AMethods for repair of photomasksIBM·Filed 1999·Granted Jul 18, 2000·76 cites·18 claims
- 0688US6156461AMethod for repair of photomasksIBM·Filed 2000·Granted Dec 5, 2000·26 cites·11 claims
- 0786US6338409B1Reticle SMIF pod in situ orientationIBM·Filed 2000·Granted Jan 15, 2002·39 cites·20 claims
- 0885US6346352B1Quartz defect removal utilizing gallium staining and femtosecond ablationIBM·Filed 2000·Granted Feb 12, 2002·49 cites·32 claims
- 0983US7867876B2Method of thinning a semiconductor substrateIBM·Filed 2008·Granted Jan 11, 2011·7 cites·18 claims
- 1080US5498313ASymmetrical etching ring with gas controlIBM·Filed 1993·Granted Mar 12, 1996·41 cites·3 claims
- 1178US6534225B2Tapered ion implantation with femtosecond laser ablation to remove printable alternating phase shift featuresIBM·Filed 2001·Granted Mar 18, 2003·17 cites·49 claims
- 1278US5882823AFib repair methodIBM·Filed 1997·Granted Mar 16, 1999·39 cites·36 claims
- 1371US6515736B1Reticle capturing and handling systemIBM·Filed 2000·Granted Feb 4, 2003·11 cites·18 claims
- 1468US6582857B1Repair of masks to promote adhesion of patchesIBM·Filed 2000·Granted Jun 24, 2003·11 cites·23 claims
- 1567US6415431B1Repair of phase shift materials to enhance adhesionIBM·Filed 2000·Granted Jul 2, 2002·8 cites·19 claims
- 1660US6110624AMultiple polarity mask exposure methodIBM·Filed 1999·Granted Aug 29, 2000·21 cites·39 claims
- 1759US7844099B2Inspection method for protecting image sensor devices with front surface protectionIBM·Filed 2006·Granted Nov 30, 2010·1 cites·6 claims
- 1855US5981110AMethod for repairing photomasksIBM·Filed 1998·Granted Nov 9, 1999·19 cites·21 claims
- 1945US6261723B1Transfer layer repair process for attenuated masksIBM·Filed 1999·Granted Jul 17, 2001·10 cites·9 claims
- 2042US2007156365A1Method and system to define multiple metrology criteria for defect screening of electrical connectionsIBM·Filed 2006·Application pending·0 cites
- 2140US2009013527A1Collapsable connection mold repair method utilizing femtosecond laser pulse lengthsIBM·Filed 2007·Application pending·0 cites
- 2235US2001028986A1Transfer layer repair process for attenuated masksIBM·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →