Inventor · disambiguated record
Tianchun Ye
Also filed as: YE TIANCHUN
15 granted patents·6 pending applications·17 citations·filing 2012–2024
86Inventor score
Top patents by PatentIndex Score
21 records- 0187US10644020B2Three-dimensional semiconductor memory device with a substrate contact region and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted May 5, 2020·6 cites·13 claims
- 0281US11839085B2Three-dimensional vertical single transistor ferroelectric memory and manufacturing method thereofINST OF MICROELECTRONICS CAS·Filed 2019·Granted Dec 5, 2023·5 cites·16 claims
- 0375US10483279B2Method of manufacturing a semiconductor deviceINST OF MICROELECTRONICS CAS·Filed 2015·Granted Nov 19, 2019·2 cites·10 claims
- 0469US9196706B2Method for manufacturing P-type MOSFETINST OF MICROELECTRONICS CAS·Filed 2012·Granted Nov 24, 2015·2 cites·14 claims
- 0564US10504916B2Semiconductor device and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2015·Granted Dec 10, 2019·1 cites·9 claims
- 0663US11056580B2Semiconductor device and manufacturing method thereofINST OF MICROELECTRONICS CAS·Filed 2015·Granted Jul 6, 2021·1 cites·5 claims
- 0760US2024365534A1Memory device, method of manufacturing memory device, and electronic apparatus including memory deviceINST OF MICROELECTRONICS CAS·Filed 2024·Application pending·0 cites
- 0859US11929304B2Semiconductor apparatus with heat dissipation conduit in sidewall interconnection structure, method of manufacturing the same, and electronic deviceINST OF MICROELECTRONICS CAS·Filed 2022·Granted Mar 12, 2024·0 cites·24 claims
- 0959US2025294834A1Semiconductor device and method of manufacturing semiconductor deviceINST OF MICROELECTRONICS CAS·Filed 2024·Application pending·0 cites
- 1052US12197282B2Data recovery method for flash memoryINST OF MICROELECTRONICS CAS·Filed 2021·Granted Jan 14, 2025·0 cites·10 claims
- 1150US2024421032A1Memory cell, three-dimensional memory, and method of operating three-dimensional memoryINST OF MICROELECTRONICS CAS·Filed 2021·Application pending·0 cites
- 1249US2022231144A1Semiconductor structure, method for manufacturing the same, and transistorINST OF MICROELECTRONICS CAS·Filed 2021·Application pending·0 cites
- 1348US11069808B2Negative capacitance field effect transistor and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2019·Granted Jul 20, 2021·0 cites·13 claims
- 1447US10991877B2Multi-state memory and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2019·Granted Apr 27, 2021·0 cites·11 claims
- 1542US9419108B2Semiconductor structure and method for manufacturing the sameLIANG QINGQING·Filed 2012·Granted Aug 16, 2016·0 cites·5 claims
- 1641US11594608B2Method for forming gate-all-around nanowire deviceINST OF MICROELECTRONICS CAS·Filed 2019·Granted Feb 28, 2023·0 cites·2 claims
- 1740US9111995B2Method for improving anti-radiation performance of SOI structureINST OF MICROELECTRONICS CAS·Filed 2012·Granted Aug 18, 2015·0 cites·6 claims
- 1839US11411091B2Structure of stacked gate-all-around nano-sheet CMOS device and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2019·Granted Aug 9, 2022·0 cites·12 claims
- 1936US2013221329A1Graphene DeviceLIANG QINGQING·Filed 2012·Application pending·0 cites
- 2035US12088323B2Read-write method and apparatus for LEPS soft decoding estimation, and electronic deviceINST OF MICROELECTRONICS CAS·Filed 2020·Granted Sep 10, 2024·0 cites·10 claims
- 2130US2018315484A1A method for operating a semiconductor memoryINST OF MICROELECTRONICS CAS·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →