Inventor · disambiguated record
To-Yu Chen
Also filed as: CHEN TO-YU
3 granted patents·2 pending applications·4 citations·filing 2004–2023
57Inventor score
Top patents by PatentIndex Score
5 records- 0158US9098894B2Defect determination in integrated circuit manufacturing processTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 4, 2015·2 cites·20 claims
- 0253US9423359B2Wafer charging electromagnetic inspection tool and method of usingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 23, 2016·1 cites·20 claims
- 0349US2025027886A1Defect inspection method and defect inspection systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0443US7205167B2Method to detect photoresist residue on a semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Apr 17, 2007·1 cites·23 claims
- 0539US2014226893A1Method and System for Image-Based Defect AlignmentTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →