Inventor · disambiguated record
Todd A. Dobson
Also filed as: DOBSON TODD A · STROUPE HUGH E
8 granted patents·197 citations·filing 1997–2007
89Inventor score
Technology areasH10P
Files withMICRON TECHNOLOGY INC8
Top patents by PatentIndex Score
8 records- 0195US6103636AMethod and apparatus for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 15, 2000·122 cites·64 claims
- 0288US6329301B1Method and apparatus for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 11, 2001·25 cites·64 claims
- 0384US6447634B1Method and apparatus for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 10, 2002·23 cites·31 claims
- 0479US6610610B2Methods for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 26, 2003·13 cites·64 claims
- 0572US6530113B2Apparatus for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 11, 2003·8 cites·31 claims
- 0658US8053371B2Apparatus and methods for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 8, 2011·0 cites·18 claims
- 0758US7244681B2Methods for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 17, 2007·3 cites·19 claims
- 0858US6889698B2Apparatus for selective removal of material from wafer alignment marksMICRON TECHNOLOGY INC·Filed 2003·Granted May 10, 2005·3 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →