Inventor · disambiguated record
Todd M Dunford
Also filed as: DUNFORD TODD · DUNFORD TODD M
23 granted patents·6 pending applications·54 citations·filing 2007–2025
93Inventor score
Top patents by PatentIndex Score
29 records- 0191US12253492B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2023·Granted Mar 18, 2025·0 cites·11 claims
- 0289US8960012B2Method and apparatus for detection and characterization of mechanical damageJENTEK SENSORS INC·Filed 2013·Granted Feb 24, 2015·13 cites·20 claims
- 0388US7451639B2Engine blade dovetail inspectionJENTEK SENSORS INC·Filed 2007·Granted Nov 18, 2008·18 cites·23 claims
- 0485US11747304B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2023·Granted Sep 5, 2023·0 cites·5 claims
- 0583US2025224374A1In-Process Quality Assessment for Additive ManufacturingJENTEK SENSORS INC·Filed 2025·Application pending·0 cites
- 0682US11543388B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2022·Granted Jan 3, 2023·0 cites·20 claims
- 0782US10732096B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2017·Granted Aug 4, 2020·2 cites·20 claims
- 0881US2025044257A1System and method for hole inspectionJENTEK SENSORS INC·Filed 2024·Application pending·0 cites
- 0979US12359945B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 1077US12061169B2System and method for hole inspectionJENTEK SENSORS INC·Filed 2022·Granted Aug 13, 2024·0 cites·20 claims
- 1176US11841245B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Dec 12, 2023·0 cites·18 claims
- 1274US2022412918A1Complex part inspection with eddy current sensorsJENTEK SENSORS INC·Filed 2022·Application pending·0 cites
- 1373US11959880B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2021·Granted Apr 16, 2024·0 cites·16 claims
- 1473US11802851B2Segmented field eddy current sensing for dispersive property measurement and complex structuresJENTEK SENSORS INC·Filed 2022·Granted Oct 31, 2023·0 cites·26 claims
- 1573US8222897B2Test circuit with sense elements having associated and unassociated primary windingsSHEIRETOV YANKO K·Filed 2008·Granted Jul 17, 2012·8 cites·20 claims
- 1671US10677756B2Integrated sensor cartridge system and method of useJENTEK SENSORS INC·Filed 2016·Granted Jun 9, 2020·1 cites·19 claims
- 1771US9823179B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2016·Granted Nov 21, 2017·1 cites·9 claims
- 1870US11435317B2Complex part inspection with eddy current sensorsJENTEK SENSORS INC·Filed 2019·Granted Sep 6, 2022·0 cites·19 claims
- 1970US11268933B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2017·Granted Mar 8, 2022·0 cites·17 claims
- 2068US11268931B2Segmented field eddy current sensing for dispersive property measurement and complex structuresJENTEK SENSORS INC·Filed 2019·Granted Mar 8, 2022·0 cites·19 claims
- 2167US11549831B2Measurement system and method of useJENTEK SENSORS INC·Filed 2019·Granted Jan 10, 2023·0 cites·18 claims
- 2266US2024377360A1Scanning System and Method for Axial Symmetric Test ObjectsJENTEK SENSORS INC·Filed 2024·Application pending·0 cites
- 2364US2025216360A1Remote current senseJENTEK SENSORS INC·Filed 2023·Application pending·0 cites
- 2461USD830863SPortable test instrumentJENTEK SENSORS INC·Filed 2017·Granted Oct 16, 2018·7 cites·1 claims
- 2561US8415947B2Method for stress assessment that removes temperature effects and hysteresis on the material property measurementsSHEIRETOV YANKO K·Filed 2012·Granted Apr 9, 2013·2 cites·9 claims
- 2654US10416118B1Measurement system and method of useJENTEK SENSORS INC·Filed 2017·Granted Sep 17, 2019·0 cites·9 claims
- 2749US2018264590A1In situ additive manufacturing process sensing and control including post process ndtJENTEK SENSORS INC·Filed 2018·Application pending·0 cites
- 2841USD857534SPortable test instrumentJENTEK SENSORS INC·Filed 2018·Granted Aug 27, 2019·2 cites·1 claims
- 2930USD842725SPortable test instrument attachmentJENTEK SENSORS INC·Filed 2017·Granted Mar 12, 2019·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →