Inventor · disambiguated record
Toby Alan Fredrickson
Also filed as: FREDRICKSON TOBY A · FREDRICKSON TOBY ALAN
10 granted patents·372 citations·filing 1995–2000
91Inventor score
Files withXILINX INC10
Top patents by PatentIndex Score
10 records- 0195US6292003B1Apparatus and method for testing chip scale package integrated circuitsXILINX INC·Filed 1998·Granted Sep 18, 2001·210 cites·9 claims
- 0276US5945837AInterface structure for an integrated circuit device testerXILINX INC·Filed 1997·Granted Aug 31, 1999·42 cites·5 claims
- 0375US6420885B1System and apparatus for low-temperature semiconductor device testingXILINX INC·Filed 2000·Granted Jul 16, 2002·20 cites·10 claims
- 0473US6292006B1Method for preventing condensation on handler board during semiconductor device testingXILINX INC·Filed 2000·Granted Sep 18, 2001·16 cites·5 claims
- 0568US5705932ASystem for expanding space provided by test computer to test multiple integrated circuits simultaneouslyXILINX INC·Filed 1995·Granted Jan 6, 1998·26 cites·13 claims
- 0662US6118286ASemiconductor device tester-to-handler Interface board with large test areaXILINX INC·Filed 1997·Granted Sep 12, 2000·21 cites·6 claims
- 0753US5952839AMethod and apparatus for a pin-configurable integrated circuit tester boardXILINX INC·Filed 1999·Granted Sep 14, 1999·15 cites·8 claims
- 0849US5907245ASystem and method for testing integrated circuits in dry atmosphereXILINX INC·Filed 1997·Granted May 25, 1999·13 cites·9 claims
- 0945US6681352B1Method for testing damaged integrated circuitsXILINX INC·Filed 2000·Granted Jan 20, 2004·3 cites·3 claims
- 1037US5936415AMethod and apparatus for a pin-configurable integrated circuit tester boardXILINX INC·Filed 1996·Granted Aug 10, 1999·6 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →