Inventor · disambiguated record
Tomohisa Fukuda
Also filed as: FUKUDA TOMOHISA
8 granted patents·5 pending applications·10 citations·filing 2008–2025
74Inventor score
Files withJEOL LTD13
Top patents by PatentIndex Score
13 records- 0184US8008633B2Specimen stage-moving device for charged-particle beam systemJEOL LTD·Filed 2008·Granted Aug 30, 2011·10 cites·10 claims
- 0266US12482629B2Specimen processing holder and specimen processing methodJEOL LTD·Filed 2023·Granted Nov 25, 2025·0 cites·12 claims
- 0361US11953410B2Specimen support tool, support apparatus and specimen preparation methodJEOL LTD·Filed 2021·Granted Apr 9, 2024·0 cites·6 claims
- 0461US2024331970A1Sample Holder and Sample Processing ApparatusJEOL LTD·Filed 2024·Application pending·0 cites
- 0561US2025323008A1Focused Ion Beam SystemJEOL LTD·Filed 2025·Application pending·0 cites
- 0659US12253445B2Specimen pretreatment methodJEOL LTD·Filed 2021·Granted Mar 18, 2025·0 cites·6 claims
- 0757US11658000B2Sample support and method of fabricating sameJEOL LTD·Filed 2020·Granted May 23, 2023·0 cites·8 claims
- 0853US2023317400A1Charged Particle Beam Source and Charged Particle Beam SystemJEOL LTD·Filed 2023·Application pending·0 cites
- 0953US2025239433A1Focused Ion Beam SystemJEOL LTD·Filed 2025·Application pending·0 cites
- 1049US11679489B2Sample chip worktable and retainerJEOL LTD·Filed 2020·Granted Jun 20, 2023·0 cites·9 claims
- 1146US10629407B2Charged particle beam deviceJEOL LTD·Filed 2018·Granted Apr 21, 2020·0 cites·4 claims
- 1242US2020371331A1Image Processing Method and Transmission Electron MicroscopeJEOL LTD·Filed 2020·Application pending·0 cites
- 1341US11037755B2Observation method, specimen support, and transmission electron microscopeJEOL LTD·Filed 2019·Granted Jun 15, 2021·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →