Inventor · disambiguated record
Tom Ho
Also filed as: HO TOM · HO TOM T · HO TOM THUY
9 granted patents·5 pending applications·45 citations·filing 2001–2024
84Inventor score
Top patents by PatentIndex Score
14 records- 0193US11698915B1Cloud platform based architecture for continuous deployment and execution of modular data pipelinesHUMANA INC·Filed 2021·Granted Jul 11, 2023·3 cites·20 claims
- 0289US7599393B1Architecture for emulating an ethernet network interface cardSIERRA WIRELESS INC·Filed 2006·Granted Oct 6, 2009·28 cites·40 claims
- 0378US12135732B1Cloud platform based architecture for continuous deployment and execution of modular data pipelinesHUMANA INC·Filed 2023·Granted Nov 5, 2024·0 cites·14 claims
- 0471US12254022B1Cloud platform based data mesh architecture for data pipelinesHUMANA INC·Filed 2021·Granted Mar 18, 2025·0 cites·6 claims
- 0568US2025106118A1Integrated development environment for development and continuous delivery of cloud-based applicationsHUMANA INC·Filed 2024·Application pending·0 cites
- 0660US12170597B2Integrated development environment for development and continuous delivery of cloud-based applicationsHUMANA INC·Filed 2022·Granted Dec 17, 2024·0 cites·20 claims
- 0760US8190952B2Bitmap cluster analysis of defects in integrated circuitsHO TOM T·Filed 2010·Granted May 29, 2012·3 cites·20 claims
- 0859US7023878B2Architecture for emulating an Ethernet network interface cardSIERRA WIRELESS INC·Filed 2001·Granted Apr 4, 2006·7 cites·14 claims
- 0958US7954018B2Analysis techniques for multi-level memoryRUDOLPH TECHNOLOGIES INC·Filed 2007·Granted May 31, 2011·4 cites·29 claims
- 1050US2013173332A1Architecture for root cause analysis, prediction, and modeling and methods thereforHO TOM THUY·Filed 2011·Application pending·0 cites
- 1142US2014236515A1Cloud-based architecture for analysis and prediction of integrated tool-related and material-related data and methods thereforHO TOM THUY·Filed 2013·Application pending·0 cites
- 1240US2013030760A1Architecture for analysis and prediction of integrated tool-related and material-related data and methods thereforHO TOM THUY·Filed 2011·Application pending·0 cites
- 1338US7685481B2Bitmap cluster analysis of defects in integrated circuitsMKS INSTR INC·Filed 2005·Granted Mar 23, 2010·0 cites·31 claims
- 1438US2013080372A1Architecture and methods for tool health predictionHO TOM THUY·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →