Inventor · disambiguated record
Toshiya Ijichi
Also filed as: IJICHI TOSHIYA
4 granted patents·80 citations·filing 1992–2002
74Inventor score
Top patents by PatentIndex Score
4 records- 0181US5384531AApparatus for inspecting characteristics of semiconductor chipsMITSUBISHI ELECTRICAL ENGINEER·Filed 1992·Granted Jan 24, 1995·67 cites·3 claims
- 0256US6738503B1Notch inspection apparatus and method based on shading pattern matchingRENESAS TECH CORP·Filed 2000·Granted May 18, 2004·8 cites·7 claims
- 0346US6804387B1Pattern matching apparatusRENESAS TECH CORP·Filed 2000·Granted Oct 12, 2004·5 cites·7 claims
- 0434US6955264B2Method of detecting protrusion of inspection object from palette and method of fabricating semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Oct 18, 2005·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →