Inventor · disambiguated record
Tomomi Ino
Also filed as: INO TOMOMI
5 granted patents·2 pending applications·70 citations·filing 1999–2015
79Inventor score
Top patents by PatentIndex Score
7 records- 0189US7324855B2Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management serverTOSHIBA KK·Filed 2005·Granted Jan 29, 2008·24 cites·20 claims
- 0281US7463941B2Quality control system, quality control method, and method of lot-to-lot wafer processingTOSHIBA KK·Filed 2006·Granted Dec 9, 2008·8 cites·20 claims
- 0367US6780657B2Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafersTOSHIBA KK·Filed 2002·Granted Aug 24, 2004·14 cites·22 claims
- 0456US6541287B2Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafersTOSHIBA KK·Filed 1999·Granted Apr 1, 2003·24 cites·8 claims
- 0540US2017274599A1Additive manufacturing apparatus and additive manufacturing methodTOSHIBA KK·Filed 2015·Application pending·0 cites
- 0640US2006085165A1Method for determining a failure of a manufacturing condition, system for determining a failure of a manufacuring condition and method for manufacturing an industrial productUSHIKU YUKIHIRO·Filed 2005·Application pending·0 cites
- 0736US9268325B2Manufacturing process monitoring system and manufacturing process monitoring methodINO TOMOMI·Filed 2011·Granted Feb 23, 2016·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →