Inventor · disambiguated record
Toshikatsu Kaneyama
Also filed as: KANEYAMA TOSHIKATSU
13 granted patents·79 citations·filing 1992–2019
90Inventor score
Technology areasH01J
Files withJEOL LTD13
Top patents by PatentIndex Score
13 records- 0182US10879035B2Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beamJEOL LTD·Filed 2019·Granted Dec 29, 2020·3 cites·9 claims
- 0279US7459680B2Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewithJEOL LTD·Filed 2006·Granted Dec 2, 2008·5 cites·10 claims
- 0376US6720558B2Transmission electron microscope equipped with energy filterJEOL LTD·Filed 2002·Granted Apr 13, 2004·13 cites·7 claims
- 0468US6483110B1Electron beam energy filterJEOL LTD·Filed 2000·Granted Nov 19, 2002·8 cites·4 claims
- 0563US5258617AMethod and apparatus for correcting axial coma in electron microscopyJEOL LTD·Filed 1992·Granted Nov 2, 1993·17 cites·6 claims
- 0659US7030389B2Electron beam apparatus having electron analyzer and method of controlling lensesJEOL LTD·Filed 2004·Granted Apr 18, 2006·4 cites·7 claims
- 0759US6573501B2Holography transmission electron microscopeJEOL LTD·Filed 2001·Granted Jun 3, 2003·5 cites·5 claims
- 0852US6586737B2Transmission electron microscope equipped with energy filterJEOL LTD·Filed 2001·Granted Jul 1, 2003·2 cites·4 claims
- 0951US7977630B2Electron microscopeJEOL LTD·Filed 2005·Granted Jul 12, 2011·0 cites·8 claims
- 1051US5264705ASpecimen-driving apparatus for electron microscope which tilts and translates while preventing contact damageJEOL LTD·Filed 1992·Granted Nov 23, 1993·12 cites·3 claims
- 1144US11640894B2Charged particle beam apparatus and control method of charged particle beam apparatusJEOL LTD·Filed 2019·Granted May 2, 2023·0 cites·3 claims
- 1242US5952656AEnergy filterJEOL LTD·Filed 1997·Granted Sep 14, 1999·5 cites·7 claims
- 1340US6140642AImaging energy filter equipped with distortion correctorJEOL LTD·Filed 1999·Granted Oct 31, 2000·5 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →