Inventor · disambiguated record
Todd Wayne Karry
Also filed as: KARRY TODD WAYNE
2 granted patents·8 citations·filing 2004–2007
50Inventor score
Technology areasG11C
Files withNAT SEMICONDUCTOR CORP2
Top patents by PatentIndex Score
2 records- 0152US7216270B1System and method for providing testing and failure analysis of integrated circuit memory devicesNAT SEMICONDUCTOR CORP·Filed 2004·Granted May 8, 2007·8 cites·39 claims
- 0235US7484143B1System and method for providing testing and failure analysis of integrated circuit memory devicesNAT SEMICONDUCTOR CORP·Filed 2007·Granted Jan 27, 2009·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →