Inventor · disambiguated record
Toshiharu Katayama
Also filed as: KATAYAMA TOSHIHARU
12 granted patents·1 pending application·329 citations·filing 1989–2006
92Inventor score
Top patents by PatentIndex Score
13 records- 0194US5786612ASemiconductor device comprising trench EEPROMMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 28, 1998·168 cites·6 claims
- 0282US5708285ANon-volatile semiconductor information storage deviceMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 13, 1998·60 cites·4 claims
- 0362US7023541B2Device inspecting for defect on semiconductor wafer surfaceRENESAS TECH CORP·Filed 2003·Granted Apr 4, 2006·6 cites·13 claims
- 0460US6233956B1Expansion valveFUJIKOKI CORP·Filed 2000·Granted May 22, 2001·12 cites·7 claims
- 0559US6636824B1Method of and apparatus for inspecting semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 21, 2003·9 cites·13 claims
- 0657US5243219ASemiconductor device having impurity diffusion region formed in substrate beneath interlayer contact holeMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Sep 7, 1993·26 cites·16 claims
- 0754US5444278ASemiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Aug 22, 1995·16 cites·19 claims
- 0853US6650129B1Method of testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Nov 18, 2003·4 cites·19 claims
- 0947US5047831AReduced resistance contact region for semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Sep 10, 1991·11 cites·6 claims
- 1044US5677204AMethod of evaluating a thin film for use in semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 14, 1997·12 cites·15 claims
- 1142US2008251742A1Pressure Control ValveISE SADATAKE·Filed 2006·Application pending·0 cites
- 1229US5850149AEvaluation method for semiconductor devicesMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 15, 1998·2 cites·5 claims
- 1324US5705027AMethod of removing etching residuesMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 6, 1998·3 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →