Inventor · disambiguated record
Tomoya Kawagoe
Also filed as: KAWAGOE TOMOYA
18 granted patents·1 pending application·419 citations·filing 1994–2022
95Inventor score
Top patents by PatentIndex Score
19 records- 0196US6421286B1Semiconductor integrated circuit device capable of self-analyzing redundancy replacement adapting to capacities of plural memory circuits integrated thereinMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 16, 2002·116 cites·16 claims
- 0287US6243307B1Semiconductor device including tester circuit suppressible of circuit scale increase and testing device of semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jun 5, 2001·69 cites·19 claims
- 0379US6895537B2Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repairRENESAS TECH CORP·Filed 2001·Granted May 17, 2005·29 cites·10 claims
- 0476US5828258ASemiconductor device and testing apparatus thereofMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 27, 1998·30 cites·11 claims
- 0575US6625072B2Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cellMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Sep 23, 2003·23 cites·13 claims
- 0671US5475268ASemiconductor device having an alignment markMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Dec 12, 1995·50 cites·6 claims
- 0769US6690241B2Ring oscillator having variable capacitance circuits for frequency adjustmentMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 10, 2004·13 cites·1 claims
- 0865US7552378B2Semiconductor device improving error correction processing rateRENESAS TECH CORP·Filed 2005·Granted Jun 23, 2009·3 cites·10 claims
- 0963US5623451ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Apr 22, 1997·23 cites·5 claims
- 1061US5680354ASemiconductor memory device capable of reading information stored in a non-volatile manner in a particular operation modeMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 21, 1997·21 cites·10 claims
- 1159US6054885ASemiconductor device and testing apparatus thereofMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 25, 2000·14 cites·9 claims
- 1256US12265160B2Positioning apparatusMITSUBISHI ELECTRIC CORP·Filed 2022·Granted Apr 1, 2025·0 cites·13 claims
- 1353US5889695ANonvolatile semiconductor memory device reduced in occupy area of memory cellMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 30, 1999·14 cites·6 claims
- 1447US7652912B2Nonvolatile semiconductor memory device performing data writing in a toggle mannerRENESAS TECH CORP·Filed 2006·Granted Jan 26, 2010·2 cites·9 claims
- 1543US6903976B2Semiconductor memory device reduced in power consumption during burn-in testRENESAS TECH CORP·Filed 2003·Granted Jun 7, 2005·3 cites·5 claims
- 1642US6208548B1Slave circuit select device which can individually select a plurality of slave circuits with one data busMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 27, 2001·8 cites·11 claims
- 1738US9761141B2Automatic driving control system and automatic driving control methodMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Sep 12, 2017·0 cites·6 claims
- 1837US2017103271A1Driving assistance system and driving assistance method for vehicleMITSUBISHI ELECTRIC CORP·Filed 2016·Application pending·0 cites
- 1930US5726949ASemiconductor memory device having a redundant configurationMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 10, 1998·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →