Inventor · disambiguated record
Tomohiko Koto
Also filed as: KOTO TOMOHIKO
10 granted patents·1 pending application·33 citations·filing 2000–2024
84Inventor score
Top patents by PatentIndex Score
11 records- 0172US6598187B1Semiconductor integrated circuit device with test circuitFUJITSU LTD·Filed 2000·Granted Jul 22, 2003·10 cites·15 claims
- 0255US7898292B2Level converterFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Mar 1, 2011·3 cites·18 claims
- 0350US7630845B2Method for calculating tolerable value for fluctuation in power supply voltage and method of testingFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 8, 2009·2 cites·8 claims
- 0450US6310826B2Semiconductor device having a test circuitFUJITSU LTD·Filed 2001·Granted Oct 30, 2001·7 cites·12 claims
- 0548US7088142B2Semiconductor integrated circuit and level conversion circuitFUJITSU LTD·Filed 2004·Granted Aug 8, 2006·5 cites·15 claims
- 0648US7019578B2Input circuitFUJITSU LTD·Filed 2004·Granted Mar 28, 2006·6 cites·28 claims
- 0745US2024250676A1Output circuitSOCIONEXT INC·Filed 2024·Application pending·0 cites
- 0842US7710145B2Semiconductor device and method for controlling thereofFUJITSU MICROELECTRONICS LTD·Filed 2009·Granted May 4, 2010·0 cites·20 claims
- 0940US11038506B2Output circuitSOCIONEXT INC·Filed 2020·Granted Jun 15, 2021·0 cites·9 claims
- 1036US10983544B2Output circuitSOCIONEXT INC·Filed 2019·Granted Apr 20, 2021·0 cites·4 claims
- 1134US9780762B2Level converter circuitSOCIONEXT INC·Filed 2016·Granted Oct 3, 2017·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →