Inventor · disambiguated record
Toshiro Kubo
Also filed as: KUBO TOSHIRO
5 granted patents·3 pending applications·80 citations·filing 1993–2010
81Inventor score
Top patents by PatentIndex Score
8 records- 0188US6765205B2Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using sameHITACHI HIGH TECH CORP·Filed 2003·Granted Jul 20, 2004·37 cites·2 claims
- 0285US6555819B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Apr 29, 2003·19 cites·22 claims
- 0365US7105815B2Method and apparatus for collecting defect imagesHITACHI HIGH TECH CORP·Filed 2004·Granted Sep 12, 2006·6 cites·9 claims
- 0464US5442182AElectron lensHITACHI LTD·Filed 1993·Granted Aug 15, 1995·16 cites·29 claims
- 0557US6979821B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Dec 27, 2005·2 cites·4 claims
- 0644US2003122074A1Scanning electron microscopeHITACHI LTD·Filed 2003·Application pending·0 cites
- 0738US2005087686A1Method of observing defectsFiled 2004·Application pending·0 cites
- 0829US2012144938A1Inspection device and methodINAGAKI KATSUYASU·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →