Inventor · disambiguated record
Todd A. Marquart
Also filed as: MARQUART TODD · MARQUART TODD A
35 granted patents·3 pending applications·329 citations·filing 2005–2025
96Inventor score
Top patents by PatentIndex Score
38 records- 0199US7292476B2Programming method for NAND EEPROMMICRON TECHNOLOGY INC·Filed 2005·Granted Nov 6, 2007·126 cites·51 claims
- 0298US7408810B2Minimizing effects of program disturb in a memory deviceMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 5, 2008·107 cites·25 claims
- 0395US11288160B2Threshold voltage distribution adjustment for bufferMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 29, 2022·4 cites·20 claims
- 0493US7499330B2Programming method for NAND EEPROMMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 3, 2009·26 cites·25 claims
- 0588US11385819B2Separate partition for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 12, 2022·2 cites·27 claims
- 0688US11360700B2Partitions within snapshot memory for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 14, 2022·2 cites·20 claims
- 0786US11449266B2Memory sub-system event log managementMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 20, 2022·2 cites·19 claims
- 0885US9183070B2Resting blocks of memory cells in response to the blocks being deemed to failMICRON TECHNOLOGY INC·Filed 2013·Granted Nov 10, 2015·8 cites·30 claims
- 0985US8320185B2Lifetime markers for memory devicesMARQUART TODD·Filed 2010·Granted Nov 27, 2012·9 cites·36 claims
- 1084US7920427B2Dynamic soft program trimsMICRON TECHNOLOGY INC·Filed 2009·Granted Apr 5, 2011·12 cites·22 claims
- 1182US8804428B2Determining system lifetime characteristicsMARQUART TODD·Filed 2011·Granted Aug 12, 2014·7 cites·32 claims
- 1280US10846165B2Adaptive scan frequency for detecting errors in a memory systemMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 24, 2020·5 cites·20 claims
- 1379US11301346B2Separate trims for buffer and snapshotMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 12, 2022·1 cites·18 claims
- 1477US8199585B2Dynamic soft program trimsMARQUART TODD·Filed 2011·Granted Jun 12, 2012·5 cites·20 claims
- 1574US7619931B2Program-verify method with different read and verify pass-through voltagesMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 17, 2009·7 cites·24 claims
- 1673US12061518B2Parity data in dynamic random access memory (DRAM)MICRON TECHNOLOGY INC·Filed 2023·Granted Aug 13, 2024·0 cites·18 claims
- 1771US12026052B2Partitioned memory having error detection capabilityLODESTAR LICENSING GROUP LLC·Filed 2022·Granted Jul 2, 2024·0 cites·20 claims
- 1871US11775208B2Partitions within snapshot memory for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 3, 2023·0 cites·20 claims
- 1970US11663104B2Threshold voltage distribution adjustment for bufferMICRON TECHNOLOGY INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 2070US7715234B2Reducing effects of program disturb in a memory deviceMICRON TECHNOLOGY INC·Filed 2008·Granted May 11, 2010·5 cites·19 claims
- 2168US11789629B2Separate partition for buffer and snapshot memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 17, 2023·0 cites·18 claims
- 2267US11579964B2Parity data in dynamic random access memory (DRAM)MICRON TECHNOLOGY INC·Filed 2020·Granted Feb 14, 2023·0 cites·19 claims
- 2366US12118229B2Memory sub-system event log managementMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 15, 2024·0 cites·16 claims
- 2464US11694763B2Read voltage calibration for copyback operationMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 4, 2023·0 cites·19 claims
- 2564US11309052B2Read voltage calibration for copyback operationMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 19, 2022·0 cites·20 claims
- 2662US11481273B2Partitioned memory having error detection capabilityMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 25, 2022·0 cites·20 claims
- 2757US11487436B2Trims corresponding to logical unit quantityMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 1, 2022·0 cites·20 claims
- 2857US11437111B2Trims corresponding to program/erase cyclesMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 2957US9269452B2Determining system lifetime characteristicsMICRON TECHNOLOGY INC·Filed 2014·Granted Feb 23, 2016·1 cites·20 claims
- 3055US11650750B2Performing asynchronous scan operations across memory subsystemsMICRON TECHNOLOGY INC·Filed 2020·Granted May 16, 2023·0 cites·17 claims
- 3152US2025336729A1Section yielding in stacked memory architecturesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3250US11556267B2Data management during a copyback operationMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 17, 2023·0 cites·16 claims
- 3345US2022057944A1Trim determination based on power availabilityMICRON TECHNOLOGY INC·Filed 2020·Application pending·0 cites
- 3444US11776629B2Threshold voltage based on program/erase cyclesMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 3, 2023·0 cites·16 claims
- 3544US8854892B2Lifetime markers for memory devicesMICRON TECHNOLOGY INC·Filed 2012·Granted Oct 7, 2014·0 cites·23 claims
- 3644US8023329B2Reducing effects of program disturb in a memory deviceMICRON TECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·0 cites·19 claims
- 3744US7952936B2Program-verify methodMICRON TECHNOLOGY INC·Filed 2009·Granted May 31, 2011·0 cites·19 claims
- 3831US2013346812A1Wear leveling memory using error rateBAHIRAT SHIRISH D·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →