Inventor · disambiguated record
Toshio Miyatake
Also filed as: MIYATAKE TOSHIO
8 granted patents·74 citations·filing 2000–2005
87Inventor score
Top patents by PatentIndex Score
8 records- 0178US6496023B1Semiconductor-device inspecting apparatus and a method for manufacturing the sameHITACHI LTD·Filed 2000·Granted Dec 17, 2002·20 cites·12 claims
- 0275US6774654B2Semiconductor-device inspecting apparatus and a method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Aug 10, 2004·16 cites·14 claims
- 0369US6614246B1Probe structureHITACHI LTD·Filed 2000·Granted Sep 2, 2003·11 cites·16 claims
- 0468US6864568B2Packaging device for holding a plurality of semiconductor devices to be inspectedRENESAS TECH CORP·Filed 2002·Granted Mar 8, 2005·10 cites·16 claims
- 0563US7432628B2Generator and method of manufacturing sameHITACHI LTD·Filed 2005·Granted Oct 7, 2008·4 cites·7 claims
- 0660US6977514B2Probe structureHITACHI LTD·Filed 2003·Granted Dec 20, 2005·6 cites·5 claims
- 0755US6465264B1Method for producing semiconductor device and apparatus usable thereinHITACHI LTD·Filed 2000·Granted Oct 15, 2002·4 cites·15 claims
- 0848US6885208B2Semiconductor device and test device for sameRENESAS TECH CORP·Filed 2002·Granted Apr 26, 2005·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →