Inventor · disambiguated record
Tohru Mogami
Also filed as: MOGAMI TOHRU
11 granted patents·2 pending applications·704 citations·filing 1995–2018
91Inventor score
Top patents by PatentIndex Score
13 records- 0198US6515511B2Semiconductor integrated circuit and semiconductor integrated circuit deviceNEC CORP·Filed 2001·Granted Feb 4, 2003·450 cites·24 claims
- 0291US5656519AMethod for manufacturing salicide semiconductor deviceNEC CORP·Filed 1996·Granted Aug 12, 1997·112 cites·21 claims
- 0384US5571735AMethod of manufacturing a semiconducter device capable of easily forming metal silicide films on source and drain regionsNEC CORP·Filed 1995·Granted Nov 5, 1996·62 cites·9 claims
- 0482US6459126B1Semiconductor device including a MIS transistorNEC CORP·Filed 2001·Granted Oct 1, 2002·33 cites·17 claims
- 0576US6933569B2Soi mosfetNEC CORP·Filed 2003·Granted Aug 23, 2005·24 cites·17 claims
- 0675US10340399B2Optical devicePHOTONICS ELECTRONICS TECHNOLOGY RES ASS·Filed 2016·Granted Jul 2, 2019·2 cites·4 claims
- 0767US10162110B2Semiconductor device and method for manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted Dec 25, 2018·1 cites·20 claims
- 0859US5593923AMethod of fabricating semiconductor device having refractory metal silicide layer on impurity region using damage implant and single step annealNEC CORP·Filed 1995·Granted Jan 14, 1997·20 cites·20 claims
- 0952US10247882B2Optical waveguide circuit and method of fabricating sameNEC CORP·Filed 2017·Granted Apr 2, 2019·0 cites·18 claims
- 1046US2018284559A1Electro-optic modulatorNEC CORP·Filed 2018·Application pending·0 cites
- 1144US10078182B2Semiconductor device and method for manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted Sep 18, 2018·0 cites·14 claims
- 1240US9985149B2Semiconductor device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted May 29, 2018·0 cites·9 claims
- 1332US2002153573A1MIS field effect transistor and manufacturing method thereofFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →