Inventor · disambiguated record
Toshinori Morihara
Also filed as: MORIHARA TOSHINORI
13 granted patents·2 pending applications·185 citations·filing 1992–2004
93Inventor score
Top patents by PatentIndex Score
15 records- 0187US6459113B1Semiconductor integrated circuit device and method of manufacturing the same, and cell size calculation method for DRAM memory cellsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 1, 2002·39 cites·7 claims
- 0271US6495418B2Method of manufacturing a semiconductor device having a capacitorMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 17, 2002·11 cites·2 claims
- 0365US5495439ASemiconductor memory device having SOI structure and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 27, 1996·30 cites·7 claims
- 0464US5888854AMethod of manufacturing a DRAM having an SOI structureMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Mar 30, 1999·27 cites·3 claims
- 0563US6597599B2Semiconductor memoryMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jul 22, 2003·10 cites·6 claims
- 0659US6377483B1Semiconductor memory device having improved memory cell and bit line pitchMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 23, 2002·10 cites·10 claims
- 0757US6756267B2Method of manufacturing a semiconductor device including a capacitor with a roughened-surface electrodeRENESAS TECH CORP·Filed 2002·Granted Jun 29, 2004·4 cites·3 claims
- 0857US6271564B1Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 7, 2001·15 cites·9 claims
- 0955US5404038ASemiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Apr 4, 1995·16 cites·8 claims
- 1051US6541807B1Semiconductor device having capacitor and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 1, 2003·5 cites·4 claims
- 1147US6487105B2Test circuit for semiconductor integrated circuit which detects an abnormal contact resistanceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 26, 2002·5 cites·8 claims
- 1245US6635538B2Method of manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 21, 2003·2 cites·4 claims
- 1343US2004219748A1Method of manufacturing a semiconductor deviceRENESAS TECH CORP·Filed 2004·Application pending·0 cites
- 1440US5378644AMethod for manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Jan 3, 1995·11 cites·12 claims
- 1537US2002195669A1Semiconductor integrated circuit device and method of manufacturing the same, and cell size calculation method for DRAM memory cellsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →