Inventor · disambiguated record
Toshiyuki Motooka
Also filed as: MOTOOKA TOSHIYUKI
10 granted patents·1 pending application·434 citations·filing 1995–2001
92Inventor score
Top patents by PatentIndex Score
11 records- 0196US6573121B2Semiconductor device, method for fabricating the semiconductor device, lead frame and method for producing the lead frameFUJITSU LTD·Filed 2001·Granted Jun 3, 2003·126 cites·15 claims
- 0296US6376921B1Semiconductor device, method for fabricating the semiconductor device, lead frame and method for producing the lead frameFUJITSU LTD·Filed 1998·Granted Apr 23, 2002·120 cites·11 claims
- 0381US5831441ATest board for testing a semiconductor device, method of testing the semiconductor device, contact device, test method using the contact device, and test jig for testing the semiconductor deviceFUJITSU LTD·Filed 1996·Granted Nov 3, 1998·58 cites·2 claims
- 0474US6339261B1Semiconductor device and process of producing sameSHINKO ELECTRIC IND CO·Filed 2000·Granted Jan 15, 2002·22 cites·3 claims
- 0573US6207477B1Semiconductor device having a ball grid array and a fabrication process thereofFUJITSU LTD·Filed 1998·Granted Mar 27, 2001·37 cites·9 claims
- 0662US5937277ASemiconductor device with reliable electrodes of projecting shape and method of forming sameFUJITSU LTD·Filed 1997·Granted Aug 10, 1999·18 cites·7 claims
- 0756US6700198B2Resin for semiconductor wireSHINKO ELECTRIC IND CO·Filed 2001·Granted Mar 2, 2004·8 cites·1 claims
- 0853US5854558ATest board for testing a semiconductor device and method of testing the semiconductor deviceFUJITSU LTD·Filed 1995·Granted Dec 29, 1998·25 cites·10 claims
- 0949US5637535ASemiconductor device with reliable electrodes of projecting shape and method of forming sameFUJITSU LTD·Filed 1995·Granted Jun 10, 1997·11 cites·16 claims
- 1039US6348416B1Carrier substrate for producing semiconductor deviceSHINKO ELECTRIC IND CO·Filed 1999·Granted Feb 19, 2002·9 cites·9 claims
- 1138US2001001714A1Semiconductor device having a ball grid array and a fabrication process thereofFUJITSU LTD·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →