Inventor · disambiguated record
Tomonori Nakano
Also filed as: NAKANO TOMONORI
26 granted patents·4 pending applications·233 citations·filing 2000–2022
95Inventor score
Top patents by PatentIndex Score
30 records- 0196US7223983B2Charged particle beam columnHITACHI HIGH TECH CORP·Filed 2005·Granted May 29, 2007·35 cites·11 claims
- 0294US7521675B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 21, 2009·20 cites·10 claims
- 0394US6704202B1Power controller and compressor for refrigeration systemMATSUSHITA REFRIGERATION·Filed 2000·Granted Mar 9, 2004·90 cites·5 claims
- 0490US7504624B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 17, 2009·13 cites·20 claims
- 0588US7714286B2Charged particle beam apparatus, aberration correction value calculation unit therefor, and aberration correction program thereforHITACHI HIGH TECH CORP·Filed 2008·Granted May 11, 2010·11 cites·13 claims
- 0688US7619218B2Charged particle optical apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 17, 2009·12 cites·10 claims
- 0785US7531799B2Charged particle beam columnHITACHI HIGH TECH CORP·Filed 2007·Granted May 12, 2009·7 cites·20 claims
- 0883US8129680B2Charged particle beam apparatus including aberration correctorHIROSE KOTOKO·Filed 2009·Granted Mar 6, 2012·7 cites·12 claims
- 0983US7834326B2Aberration corrector and charged particle beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 16, 2010·7 cites·16 claims
- 1082US7718976B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 18, 2010·6 cites·14 claims
- 1181US9287084B2Aberration corrector and charged particle beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2015·Granted Mar 15, 2016·3 cites·15 claims
- 1281US7915582B2Method for estimation of probe shape in charged particle beam instrumentsHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 29, 2011·5 cites·12 claims
- 1379US8168951B2Charged particle beam apparatusKAWASAKI TAKESHI·Filed 2009·Granted May 1, 2012·4 cites·6 claims
- 1474US9378703B2KVM switch and computer readable mediumNAKANO TOMONORI·Filed 2009·Granted Jun 28, 2016·3 cites·7 claims
- 1572US8581190B2Charged particle beam apparatus and geometrical aberration measurement method thereforNAKANO TOMONORI·Filed 2009·Granted Nov 12, 2013·3 cites·19 claims
- 1668US11069505B2Aberration corrector and electron microscopeHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 20, 2021·1 cites·11 claims
- 1767US8772732B2Scanning charged particle beam device and method for correcting chromatic spherical combination aberrationNAKANO TOMONORI·Filed 2010·Granted Jul 8, 2014·2 cites·12 claims
- 1867US8258475B2Charged particle radiation device provided with aberration correctorHIROSE KOTOKO·Filed 2010·Granted Sep 4, 2012·2 cites·20 claims
- 1964US10446361B2Aberration correction method, aberration correction system, and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 15, 2019·1 cites·15 claims
- 2057US9343260B2Multipole and charged particle radiation apparatus using the sameURANO KOTOKO·Filed 2012·Granted May 17, 2016·1 cites·9 claims
- 2152US8558171B2Charged particle beam apparatus including aberration correctorHIROSE KOTOKO·Filed 2012·Granted Oct 15, 2013·0 cites·13 claims
- 2251US8436899B2Method and apparatus of tilted illumination observationKAWASAKI TAKESHI·Filed 2009·Granted May 7, 2013·0 cites·10 claims
- 2350US2011210248A1Charged particle beam instrument comprising an aberration correctorHITACHI HIGH TECH CORP·Filed 2011·Application pending·0 cites
- 2449US2025046565A1Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2547US11004650B2Multipole lens, aberration corrector using the same, and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted May 11, 2021·0 cites·18 claims
- 2646US12354826B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 8, 2025·0 cites·8 claims
- 2742US9530614B2Charged particle beam device and arithmetic deviceHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 27, 2016·0 cites·10 claims
- 2840US8987680B2Multipole measurement apparatusNAKANO TOMONORI·Filed 2012·Granted Mar 24, 2015·0 cites·12 claims
- 2936US2021249218A1Multipole lens, aberration corrector using same, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 3033US2013068949A1Charged particle beam device provided with automatic aberration correction methodURANO KOTOKO·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →